Development of an X-Ray Interferometer for High-Resolution Phase-Contrast X-Ray Imaging
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概要
- 論文の詳細を見る
An X-ray interferometer for high-resolution phase-contrast X-ray imaging was developed by thinning the central part of the analyzer crystal of a triple Laue-case (LLL) X-ray interferometer. The interferometer was tested at beamline 47XU at the Spring-8, and the improvement of the resolution of interference patterns was successfully observed for a plastic sphere of 1 mm diameter.
- 社団法人応用物理学会の論文
- 1999-12-15
著者
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HIRANO Keiichi
Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization
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Momose A
Univ. Tokyo Tokyo Jpn
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Hirano Keiichi
Institute Of Materials Structure Science High Energy Accelerator Research Organization
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Momose Atsushi
Advanced Research Laboratory Hitachi Ltd.
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Hirano Keiichi
Institute of Materials Structure Science, High Energy Accelerator Research Organization
関連論文
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- Application of an X-Ray Transmission Phase Plate to Measurements of X-Ray Magnetic Circular Dichroism
- Two-Beam X-ray Interferometer Using Diffraction in Multiple Bragg--Laue Mode
- X-ray Interference Fringes in Transmitted Beam of Bragg Mode from Very Weakly Bent Crystal
- Determination of Constant Strain Gradients of Elastically Bent Crystal Using X-ray Mirage Fringes
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