Amplification of Reflected X-ray Beams by the Mirage Effect
スポンサーリンク
概要
- 論文の詳細を見る
By measuring X-rays from a bent Si single crystal, we have observed the amplification of the reflected beams from the surface. The amplification is observed when the incident angle is adjusted to minimize the effective linear absorption coefficient due to the dynamical diffraction effect. When we increase the width of the incident X-rays along the incident azimuth, we observe on increase in reflected beam intensity. The amplification can be explained by the addition of the electric fields of the propagating beams along hyperbolic trajectories in the bent crystal to those of the reflected beams.
- 2009-10-15
著者
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平野 健二
埼玉工大
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HIRANO Kenji
Saitama Institute of Technology
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FUKAMACHI Tomoe
Saitama Institute of Technology
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YOSHIZAWA Masami
Saitama Institute of Technology
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NEGISHI Riichirou
Saitama Institute of Technology
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HIRANO Keiichi
Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization
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Kawamura Takaaki
Department Of Applied Physics School Of Science And Engineering Waseda University
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Fukamachi Tomoe
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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Kanematsu Yoshinobu
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan
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Ju Dongying
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan
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Tohyama Masahiko
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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Ju Dongying
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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Hirano Keiichi
Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization, 1-1 Oho, Tukuba, Ibaraki 305-0801
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Kanematsu Yoshinobu
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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Yoshizawa Masami
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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Negishi Riichirou
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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Kawamura Takaaki
Department of Mathematics and Physics, University of Yamanashi, Kofu 400-8510
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