Development of Energy-Filtered Reflection High-Energy Electron Diffraction Apparatus
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概要
- 論文の詳細を見る
A new type of reflection high-energy electron diffraction (RHEED) apparatus equipped with an energy filter has been developed. The apparatus can exclude the inelastically scattered electrons from the RHEED pattern for the first time. Performance of the apparatus is demonstrated using a Si(001)2×1 surface. The energy-filtered RHEED (EF-RHEED) can extract valuable information from the background. Furthermore; it can be used to measure energy loss spectra of diffraction spots.
- 社団法人応用物理学会の論文
- 1995-10-15
著者
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Hashimoto Y
Department Of Electrical And Electronic Engineering Faculty Of Engineering Shinshu University
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ICHIMIYA Ayahiko
Department of Applied Physics, Faculty of Engineering, Nagoya University
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Horio Yoshimi
Department of Applied Electronics, Daido Institute of Technology
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HASHIMOTO Yasuyuki
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University
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Ichimiya A
Nagoya Univ. Nagoya Jpn
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Ichimiya Ayahiko
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Horio Yoshimi
Department Of Applied Electronics Daido Institute Of Technology
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Horio Yoshimi
Department Of Quantum Engineering Graduate School Of Engineering Nagoya University
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SHIBA Katsuyuki
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University
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Hashimoto Yasuyuki
Department Of Quantum Engineering Graduate School Of Engineering Nagoya University
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Shiba Katsuyuki
Department Of Quantum Engineering Graduate School Of Engineering Nagoya University
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