Auger Intensity from Si(001)$2{\times}2$–Al Surface Excited by Wave-Field in Medium-Energy Electron Diffraction
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概要
- 論文の詳細を見る
From dynamical analysis of rocking curves from both reflection high-energy electron diffraction (RHEED) and medium-energy electron diffraction (MEED), the surface of Si(001)$2{\times}2$–Al was confirmed to have a parallel-dimer structure. Furthermore, dynamical calculation, usually used to determine RHEED intensity, was confirmed to also be effective for the calculation of MEED intensity. The incident electron density distribution, or "wave-field", was calculated for MEED conditions on the basis of the surface structure model. The wave-field at the surface is very sensitive to changes in diffraction conditions, such as the incident glancing angle. The Al(LMM) Auger electron intensity emitted from the Si(001)$2{\times}2$–Al surface during MEED correlated to the wave-field intensity on the Al atomic rows relatively well.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2009-06-25
著者
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Sakai Daisuke
Department Of Computer Science Kitami Institute Of Technology
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Horio Yoshimi
Department Of Applied Electronics Daido Institute Of Technology
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Horio Yoshimi
Department of Electrical and Electronic Engineering, School of Engineering, Daido University, 10-1 Takiharu-cho, Minami-ku, Nagoya 457-8530, Japan
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Sakai Daisuke
Department of Electrical and Electronic Engineering, School of Engineering, Daido University, 10-1 Takiharu-cho, Minami-ku, Nagoya 457-8530, Japan
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