Technological Trends of Soft Error Estimation Based on Accurate Estimation Method
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概要
- 論文の詳細を見る
Soft errors have become a serious problem in very large scale integrated circuit (VLSI) circuits. Although the accurate estimations of neutron- and $\alpha$-induced soft error rates (SERs) are essential, the magnitude relationship between neutron- and $\alpha$-induced SERs has long been unclear. Recently, a sensitive dosimetry vacuum alpha ray tracking method has been developed and it has enabled us to eliminate the uncertainty of the rate of $\alpha$-particle emission from materials. In this study, technology trends of SERs in static random access memory (SRAM) and latch circuits are investigated by neutron- and $\alpha$-accelerated tests and SER simulations. The magnitude relationship between neutron- and $\alpha$-induced SERs is clearly discussed on the basis of newly obtained $\alpha$-dose rates.
- 2006-04-30
著者
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TOSAKA Yoshiharu
Fujitsu Laboratories Ltd.
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Hatanaka Kichiji
Research Center For Nuclear Physics Osaka University
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Matsuoka Nobuyuki
Research Center For Nuclear Physics Osaka University
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Oka Hideki
Fujitsu Laboratories Ltd
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Satoh Shigeo
Fujitsu Laboratories Ltd.
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UEMURA Taiki
Fujitsu Laboratories Ltd.
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Satoh Shigeo
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Takasu Ryozo
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Ehara Hiedo
Fujitsu Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Oka Hideki
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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