TOSAKA Yoshiharu | Fujitsu Laboratories Ltd.
スポンサーリンク
概要
関連著者
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TOSAKA Yoshiharu
Fujitsu Laboratories Ltd.
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Satoh Shigeo
Fujitsu Laboratories Ltd.
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UEMURA Taiki
Fujitsu Laboratories Ltd.
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SATOH Shigeo
FUJITSU Ltd.
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SUZUKI Kunihiro
Fujitsu Laboratories Ltd.
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Suzuki Kunihiro
Fujitsu Laboratories Limited., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan
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Suzuki Kunihiro
Department Of Histology Cytology And Developmental Anatomy Nihon University School Of Dentistry At M
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Suzuki K
Oki Electric Ind. Co. Ltd. Hachioji‐shi Jpn
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Satoh S
Communications Res. Lab. Koganei‐shi Jpn
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TANABE Ryo
Fujitsu Laboratories Ltd.
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ANZAI Hiromi
Fujitsu Laboratories Ltd.
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SUGII Toshihiro
FUJITSU LABORATORIES LTD.
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Hatanaka Kichiji
Research Center For Nuclear Physics Osaka University
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Itakura Toru
Fujitsu Laboratories Ltd.
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Oka Hideki
Fujitsu Laboratories Ltd
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Itakura Toru
Fujitsu Laboratories Ltd
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Sugii T
Fujitsr Ltd. Akiruno-shi Jpn
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TAKAHISA Keiji
Research Center for Nuclear Physics, Osaka University
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HATANAKA Kichiji
Research Center for Nuclear Physics, Osaka University
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Horie H
Fujitsu Lab. Ltd. Atsugi Jpn
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Takahisa Keiji
Research Center For Nuclear Physics Osaka University
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Oka H
Fujitsu Laboratories Ltd.
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OKA Hideki
Fujitsu Laboratories Ltd.
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MATSUYAMA Hideya
FUJITSU LSI Quality Assurance Div.
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Tanaka Tsuyoshi
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Matsuoka Nobuyuki
Research Center For Nuclear Physics Osaka University
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Terahara Takafumi
The Authors Are With Optoelectronic Systems Laboratory Network System Laboratories Fujitsu Laborator
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Tanaka T
Semiconductor Device Research Center Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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HORIE Hiroshi
Fujitsu Laboratories Ltd.
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TANAKA Tetsu
Fujitsu Laboratories Ltd.
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Satoh Shigeo
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Takasu Ryozo
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Ehara Hiedo
Fujitsu Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Takahisa Keiji
Osaka University, 10-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Fukuda Mitsuhiro
Osaka University, 10-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Hatanaka Kichiji
Osaka University, 10-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Oka Hideki
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Tosaka Yoshiharu
Fujitsu Microelectronics Ltd., 1500 Mizono, Tado, Kuwana, Mie 511-0192, Japan
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Anzai Hiromi
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
著作論文
- New Scheme of Electrostatic Discharge Circuit Simulations Using Protection Device Model with Generated-Hole-Dependent Base Resistance
- High-Speed and Low-Power n^+-p^+ Double-Gate SOI CMOS
- Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops
- Scaling Law for Secondary Cosmic-Ray Neutron-Induced Soft-Errors in DRAMs
- Impact of Current Gain Increment Effect on Alpha Particle Induced Soft Errors in SOI DRAMs
- Theoretical Study of Alpha-Particle-Induced Soft Errors in Submicron SOI SRAM (Special Issue on ULSI Memory Technology)
- Novel Soft Error Hardened Latches and Flip-Flops
- Neutron-induced Soft-Error Simulation Technology for Logic Circuits
- Robust Flip-Flop Circuit against Soft Errors for Combinational and Sequential Logic Circuits
- Soft Error Hardened Latch and Its Estimation Method
- Neutron-Induced Soft-Error Simulation Technology for Logic Circuits
- Technological Trends of Soft Error Estimation Based on Accurate Estimation Method
- New Scheme of Electrostatic Discharge Circuit Simulations Using Protection Device Model with Generated-Hole-Dependent Base Resistance