Thickness and Stress Polarity Effects on the Reliability of the Low Thermal Budget Polyoixdes : Semiconductors

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2001-10-15

著者

• CHEN Hong

  Department of Pediatrics, The Third Affiliated Hospital, Sun Yat-sen University

• Chen Hong

  Department Of Electronics Engineering And Institute Of Electronics National Chiao-tung University

• Sun Yong

  Department Of Burns & Plastic Surgery Beijing Ji-shui-tan Hospital

• CHANG Kow

  Department of Electronic Engineering and Institute of Electronics, National Chiao Tung University, N

• Sun Yong

  Department Of Electronics Engineering And Institute Of Electronics Of National Chiao-tung University

• Chang K

  National Chiao‐tung Univ. Hsin‐chu Twn

• Chen Hong

  Department Of Biology Shenyang Teachers' College:(present Address)biological Laboratory Sapporo

• CHUNG Yuan

  Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University

• LEE Tzyh

  Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University

• Lee Tzyh

  Department Of Electronics Engineering And Institute Of Electronics Of National Chiao-tung University

• Chung Y

  National Chiao‐tung Univ. Hsin‐chu Twn

• Chung Yuan

  Department Of Electronics Engineering And Institute Of Electronics Of National Chiao-tung University

• Lee Tzyh

  Department Of Electronics Engineering And Institute Of Electronics National Chiao-tung University

• Sun Yong

  Department of Applied Science for Integrated System Engineering, Graduate School of Engineering, Kyushu Institute of Technology

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