Energy Losses of 12-32 keV H^+, He^+ and N^+ Ions at Glancing Angle Scattering from Clean Surfaces of Silicon Crystals
スポンサーリンク
概要
- 論文の詳細を見る
The energy spectra of scattered ions of 12-32 keV H^+, He^+ and N^+ have been measured at glancing angle incidence on the clean (001) and (111) surfaces of Si. A similar formula of the position-dependent stopping power which has been derived for high energy light ions was used to analyze the present results of low energy ions.
- 社団法人日本物理学会の論文
- 1993-05-15
著者
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FUJII Yoshikazu
Department of Biological Chemistry, Faculty of Agriculture, Yamaguchi University
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Kimura K
Univ. Tokyo Tokyo Jpn
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Kimura K
Faculty Of Engineering Tokyo University Of Agriculture And Technology
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FUJIWARA SHINSUKE
Department of Bioscience, School of Science and Technology, Kwansei Gakuin University
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Mannami M
Department Of Engineering Science Kyoto University
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Narumi Kazumasa
Department of Engineering Science, Kyoto University
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Kishine Keiji
Department of Engineering Science, Kyoto University
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Kimura Kenji
Department of Engineering Science, Kyoto University
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Mannami Michi-hiko
Department of Engineering Science, Kyoto University
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Fujiwara S
Mitsubishi Electric Corp. Kamakura Jpn
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Fujiwara Shinsuke
Department Of Bioscience School Of Science And Technology Kwansei Gakuin University
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Kishi Kazuhiko
Institute For Solid State Physics The University Of Tokyo
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Fujii Yoshikazu
Department Of Biological Chemistry Faculty Of Agriculture Yamaguchi University
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MANNAMI Michihiko
Department of Engineering Science, Kyoto University
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Mannami Michihiko
Deparment Of Engineering Science Kyoto University
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Kishine Keiji
Department Of Engineering Science Kyoto University
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Narumi Kazumasa
Department Of Engineering Science Kyoto University
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Mannami Michi-hiko
Department Of Engineering Science Kyoto University
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Kimura Kenji
Deparment Of Engineering Science Kyoto University
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Fujiwara Shinsuke
Department Of Bioscience Graduate School Of Science And Technology Kwansei-gakuin University:researc
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Kishine Keiji
Department Of Electronic Systems Engineering The University Of Shiga Prefecture
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Mannami Michi-hiko
Deparment of Engineering Science,Kyoto University
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