Observation of Electron-Irradiation Damages in LiF Single Crystal by Electron Microscope

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Energy Losses of 12-32 keV H^+, He^+ and N^+ Ions at Glancing Angle Scattering from Clean Surfaces of Silicon Crystals
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Dechannelling of Energetic Charged Particles at Dislocations in An-Ag Solid Solution
Detection of Fast Ions by Self-Scanning Photodiode Array
Observation of Electron-Irradiation Damages in LiF Single Crystal by Electron Microscope
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