A Systematic Change of Electrical Resistivity in Al_5(Mg_xLi_1-x)_3.5〜4Cu_1 Icosahedral Quasicrystals
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概要
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We have measured electrical resistivities from 4.2 K to room temperature in quaternary icosahedral-phase (I-phase) alloys of A1.(Mg.Li. .)..,-.Cu. (03,v3 1), wherethe e / a ratio changes from 2.1 to 2.4. The quality of the I-phase is decreased, the reststivity at 4.2K decreases drastically from 800 to 60 qOcm, and the temperaturecoefficient of resistivity changes from negative to positive as x increases. Theseresults, together with the previously reported electronic specific-heat clata, are inferpreied by the presence of a structure-induced pseudogap, which is affected by thequasicrystallinity, in the electron density of states at the position corresponding toe/a=2.1.[quasicrystal, icosahedral phase, AN-Li-Mg-Cu alloy, electrical resistivity, tem- lf perature dependence of resistivityl
- 社団法人日本物理学会の論文
- 1990-04-15
著者
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Hashimoto Tatsuo
Institute For Solid State Physics The University Of Tokyo
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Kimura K
Univ. Tokyo Tokyo Jpn
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Kimura K
Faculty Of Engineering Tokyo University Of Agriculture And Technology
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Takeuchi S
Toppan Printing Co. Ltd. Saitama Jpn
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Hashimoto T
International Superconductivity Technol. Center Tokyo Jpn
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Takeuchi S
Sci. Univ. Tokyo Chiba
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KIMURA Kaoru
Institute for Solid State Physics,University of Tokyo
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TAKEUCHI Shin
Institute for Solid State Physics,University of Tokyo
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KISHI Kazuhiko
Institute for Solid State Physics,the University of Tokyo
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Kishi Kazuhiko
Institute For Solid State Physics The University Of Tokyo
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Kimura Kaoru
Institute For Solid State Physics The University Of Tokyo
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Takeuchi Shin
Institute For Solid State Physics The University Of Tokyo
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Kimura Kenji
Deparment Of Engineering Science Kyoto University
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