Lattice Image Observation of Extended Dislocations in CdS by High Resolution Electron Microscopy
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概要
- 論文の詳細を見る
Atomistic configurations of extended glide dislocations multiplied on the basal plane in CdS have been observed for the first time by high resolution electron microscopy. From the widths of the 60°-dislocation (〜9.0 nm) and the screw dislocations (〜3.6 nm), the energy of the intrinsic stacking fault has been estimated to be 13±2 mJ/m^2.
- 社団法人応用物理学会の論文
- 1982-10-20
著者
-
Kanaya Koichi
Kogakuin University
-
Takeuchi Shin
Institute For Solid State Physics The University Of Tokyo
-
Suzuki Kunio
Institute For Solid State Physics University Of Tokyo
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