TEM and HRTEM Observations of Microstructural Change of Silicon Single Crystal Scratched under Very Small Loading Forces by AFM
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2008-06-01
著者
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IWATA Hiroyuki
Department of Molecular Pathogenesis, Nagoya University School of Medicine
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Sasaki Katsuhiro
Department Of Physics Graduate School Of Science Tohoku University
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Takagi Makoto
Department Of Organic Synthesis Faculty Of Engineering Kyushu University
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Onodera Kenji
Graduate School Aichi Institute Of Technology
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SAKA Hiroyasu
Department of Quantum Engineering, Nagoya University
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MATSUMURO Akihito
Department of Mechanical Engineering, Nagoya University
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Matsumuro Akihito
Department Of Mechanical Engineering Aichi Institute Of Technology
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Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
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Takagi Makoto
Department Of Mechanical Engineering Aichi Institute Of Technology
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Takagi Makoto
Department Of Chemical Science And Technology Faculty Of Engineering Kyushu University
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Iwata Hiroyuki
Department Of Electrical And Electronics Engineering Aichi Institute Of Technology
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Sasaki Katsuhiro
Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University, 1-1 Tegata Gakuen-machi, Akita 010-8502, Japan
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IWATA HIROYUKI
Department of Applied Chemistry, Graduate School of Engineering, Tokyo Metropolitan University
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