Straining Apparatus for Dynamic Observation by X-Ray Topography
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概要
- 論文の詳細を見る
In order to carry out the dynamic observation of dislocation behaviour by X-ray topography, two kinds of straining apparatus have been developed; one for room-temperature deformation and the other for high temperatures. By using these apparatuses and a TV-VTR system for X-ray topography, continuous video recording of the dynamic behaviour of dislocations in a stressed crystal can be made in the temperature range from room temperature to 1173 K.In-situ deformation experiments of Cu-4 at.%Al single crystals showed that the first slip initiates at a stress level of about two-thirds of the yield stress and that the propagation speed of the slip line at this stress level is about 1 mm・s^<-1>. It was also shown in high-temperature deformation of silicon single crystals that the deformation proceeds by the propagation of plastic zones developed from strain centers existing in the surface layer of the specimens.
- 社団法人応用物理学会の論文
- 1981-08-05
著者
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戸野 保
佐賀大学医学部附属病院MEセンター
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SUZUKI Masami
Department of Safety Assessment, Fuji Gotemba Research Laboratory, Chugai Pharmaceutical Co., Ltd.
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IMURA Toru
Department of Mechanical Engineering, Aichi Institute of Technology
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Imura Toru
Department Of Metallurgy
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Saka Hiroyasu
Department Of Metallurgy
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Nishino Yoichi
Department Of Crystalline Materials Science Faculty Of Engineering Nagoya University
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Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
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TONO Tamotsu
Department of Metallurgy
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Suzuki Masami
Department Of Metallurgy
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Suzuki Masami
Department Of Biochemistry Faculty Of Veterinary Medicine Hokkaido University
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Imura Toru
Department Of Mechanical Engineering Aichi Institute Of Technology
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SUZUKI Masami
Department of Agricultural Chemistry, Gifu University
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