Saka Hiroyasu | Department Of Merallurgy Faculty Of Ecgineering Nagoya University

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概要

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著作論文

In-situ Electron Holography Observation of FePt Nanoparticles at Elevated Temperatures
Effect of Pt Substitution by Cu on Structural and Morphological Changes in Fe-Pt Nanoparticles during Annealing as Studied by In-situ Transmission Electron Microscopy
Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites
Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam
Examination of electrostatic potential distribution across an implanted p-n junction by electron holography
Transmission Electron Microscopy of Interfaces in Joints between Pb-Free Solders and Electroless Ni-P
Direct Intensification of Electorn Microscopic Images with Silicon Diode Array Target
TEM and HRTEM Observations of Microstructural Change of Silicon Single Crystal Scratched under Very Small Loading Forces by AFM
In situ HREM observation of nucleation and growth of nanotwins beneath the solid-liquid interface in Si
Characteristics of Light Emission Lifetime of Electroluminescent Phosphor Encapsulated by Titanium-Silicon-Oxide Film(Surfaces, Interfaces, and Films)
A Push-Pull Straining Device for HVEM In-Situ Deformation Experiment
Dislocation Motions in Strongly Electron-Irradiated Aluminum
Direct Observation of Dislocation Motions in Iron at Low Temperatures by HVEM
A New Tensile Testing Device Usable from Room Temperature to -150℃ in an Electron Microscope
A New Tensile Testing Device Usable at -150℃ for Electron Microscopic Observation
Novel Transparent Conductive Indium Zinc Oxide Thin Films with Unique Properties
Valence Change of Cations in Ceria-Zirconia Solid Solution Associated with Redox Reactions Studied with Electron Energy-Loss Spectroscopy
Microstructural investigation of ceria-zirconia solid solution with oxygen vacancies
Straining Apparatus for Dynamic Observation by X-Ray Topography
Usage of the Fiber Plate Image Orthicon for Quick Video Recording of Electron Microscopic Images
Direct Observation of Luders Band Propagation in Silicon Iron Single Crystal by HVEM
Direct Observation of Multiplication of Dislocations in Iron Single Crystal by High Voltage Electron Microscopy (HVEM)
Microstructures of galvannealing coats plated on an iron substrate deformed by indentation
FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings
Stress Measurable Tensile Device for Electron Microscopic Observation
Direct Observation of Propagation of Crack by High Voltage Electron Microscopy (HVEM)
On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic Observation
Direct Measurement of Mobility of Edge and Screw Dislocations in 3% Silicon-Iron by High Voltage Transmission Electron Microscopy
A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron Microscopy
Direct Measurements of the Mobilities of Edge and Screw Dislocations in Fe-3%Si Alloy by High Voltage Electron Transmission Microscopy
TEM Observation of Dislocation Emissin from a Crack at DBTT in SI
Characteristics of Indium-Tin-Oxide/Silver/Indium-Tin-Oxide Sandwich Films and Their Application to Simple-Matrix Liquid-Crystal Displays
Microstructural characterization of plasma-sprayed oxide ceramics.
Measurement of the Stress and Strain on Specimens in an Electron Microscope

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