KATO Naoko | Semiconductor Device Failure Analysis, ITES Co.Ltd
スポンサーリンク
概要
関連著者
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KATO Naoko
Semiconductor Device Failure Analysis, ITES Co.Ltd
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KATO Naoko
Structural Analysis, International Test and Engineering Services Co. Ltd
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Kato Naoko
Structural Analysis International Test And Engineering Services Co. Ltd
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Sasaki Katsuhiro
Department Of Physics Graduate School Of Science Tohoku University
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Hirayama Tsukasa
Japan Fine Ceramics Center
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SAKA Hiroyasu
Department of Quantum Engineering, Nagoya University
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Maruyama Hideo
Semiconductor Device Failure Analysis Ites Co.ltd
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SAKA Hiroyasu
Semiconductor Device Failure Analysis, ITES Co.Ltd
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Wang Zhouguang
Japan Fine Ceramics Center
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Saka H
Department Of Quantum Engineering Nagoya University
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Sakaki Katsuhiro
Department Of Quantum Engineering Nagoya University
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URATA Kenya
Image Sense Co., Ltd
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Urata Kenya
Image Sense Co. Ltd
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Hirayama T.
Japan Fine Ceramics Center
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Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
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Hirayama T
Japan Fine Ceramics Center Nagoya Jpn
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Saka Hiroyasu
Semiconductor Device Failure Analysis Ites Co.ltd
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Sasaki Katsuhiro
Dep. Of Quantum Engineering Nagoya Univ.
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Sasaki Katsuhiro
Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University, 1-1 Tegata Gakuen-machi, Akita 010-8502, Japan
著作論文
- Preparation of TEM plane view sections on semiconductor device using the tripod-polisher and chemical etching
- Examination of electrostatic potential distribution across an implanted p-n junction by electron holography