Hirayama T | Japan Fine Ceramics Center Nagoya Jpn
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概要
関連著者
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Hirayama T.
Japan Fine Ceramics Center
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Hirayama T
Japan Fine Ceramics Center Nagoya Jpn
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Hirayama Tsukasa
Japan Fine Ceramics Center
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Yamamoto K
Kobayasi Institute Of Physical Research
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Sasaki Katsuhiro
Department Of Physics Graduate School Of Science Tohoku University
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SAKA Hiroyasu
Department of Quantum Engineering, Nagoya University
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Yamamoto K
Storage Media Systems Development Center Matsushita Elec. Ind. Co. Ltd.
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Wang Zhouguang
Japan Fine Ceramics Center
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Saka H
Department Of Quantum Engineering Nagoya University
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Sakaki Katsuhiro
Department Of Quantum Engineering Nagoya University
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Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
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Sasaki Katsuhiro
Dep. Of Quantum Engineering Nagoya Univ.
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Sasaki Katsuhiro
Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University, 1-1 Tegata Gakuen-machi, Akita 010-8502, Japan
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YAMAMOTO Kazuo
Japan Society for the Promotion of Science
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MIYASHITA Kimiya
Japan Fine Ceramics Center
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TANJI Takayoshi
Department of Electronics, Nagoya University
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KATO Naoko
Structural Analysis, International Test and Engineering Services Co. Ltd
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Kato Naoko
Structural Analysis International Test And Engineering Services Co. Ltd
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Tanji T
Nagoya Univ. Nagoya Jpn
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KURODA Kotaro
Department of Materials Science and Engineering, Nagoya University
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日比野 倫夫
日本電子顕微鏡学会名古屋大学理工科学総合研究センター
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YAMAMOTO Kazuo
Department of Clinical Laboratory Medicine, Shiga University of Medical Science
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TANJI Takayoshi
Center for Integrated Research in Science and Engineering. Nagoya University
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SAITO Tomohiro
Japan Fine Ceramics Center
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NAKANISHI Masatoshi
Department of Quantum Engineering, Nagoya University
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FURUSAWA Gen-ichi
Analysis Technology Center, FUJIFILM Corporation
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WAKI Kokichi
Frontier Core Technology Laboratories, FUJIFILM Corporation
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HATTORI Yasushi
Recording Media Research & Development Laboratories, FUJIFILM Corporation
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KATO Takeharu
Japan Fine Ceramics Center
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Yamamoto Kotaro
Second Department Of Surgery Yamaguchi University School Of Medicine
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KAWAJIRI Ikuo
Department of Electronics Nagoya University
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HIBINO Michio
Center for Integrated Research in Science & Engineering Nagoya University
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Kato Takeharu
Materials Research And Development Laboratory Japan Fine Ceramics Center
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KATO Naoko
Semiconductor Device Failure Analysis, ITES Co.Ltd
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Waki Kokichi
Frontier Core Technology Laboratories Fujifilm Corporation
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Kuroda Kotaro
Department Of Quantum Engineering Nagoya University
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FUKUNAGA Keiichi
Japan Fine Ceramics Center
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WANG Zhou-Guang
Japan Fine Ceramics Center
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URATA Kenya
Image Sense Co., Ltd
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Urata Kenya
Image Sense Co. Ltd
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MA X.
Japan Fine Ceramics Center
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YAMAGIWA K.
Superconductivity Research Laboratory, (ISTEC)
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SHIBATA J.
Japan Fine Ceramics Center
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HIRABAYASHI I.
Superconductivity Research Laboratory, (ISTEC)
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IKUHARA Y.
Department of Materials Science, University of Tokyo
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Hattori Yasushi
Recording Media Research & Development Laboratories Fujifilm Corporation
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Kuroda Kotaro
Graduate School Of Engineering Nagoya University
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Kuroda Kotaro
Department Of Engineering Nagoya University
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Saito Tomohiro
Japan Fine Ceramics Center Nagoya Jpn
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Yamamoto Kazuo
Department Of Biomolecular Sciences Graduate School Of Life Sciences Tohoku University
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Tanji Takayoshi
Department Of Applied Physics Osaka University
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Furusawa Gen-ichi
Analysis Technology Center Fujifilm Corporation
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Nakanishi Masatoshi
Department Of Quantum Engineering Nagoya University
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Ikuhara Y.
Department Of Materials Science University Of Tokyo
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X.L. Ma
Japan Fine Ceramics Center
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Shibata K.
Japan Fine Ceramics Center
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Nakanishi Masatoshi
Department of Agricultural Chemistry, Faculty of Agriculture, Kyoto University
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Yamamoto Kazuo
Department of Biology, Chiba University
著作論文
- In-situ Electron Holography Observation of FePt Nanoparticles at Elevated Temperatures
- Amplitude-division three-electron-wave interference for observing pure phase objects having low spatial frequency
- Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms
- High precision phase-shifting electron holography
- Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam
- Examination of electrostatic potential distribution across an implanted p-n junction by electron holography
- Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system
- Characterization of the YbBa_2Cu_3O_ and YBa_2Cu_3O_ thin superconducting films prepared by chemical solution deposition on MgO(001) substrate