Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system
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概要
- 論文の詳細を見る
- 2004-10-01
著者
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Hirayama Tsukasa
Japan Fine Ceramics Center
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KATO Takeharu
Japan Fine Ceramics Center
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Kato Takeharu
Materials Research And Development Laboratory Japan Fine Ceramics Center
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Wang Zhouguang
Japan Fine Ceramics Center
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Hirayama T.
Japan Fine Ceramics Center
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Hirayama T
Japan Fine Ceramics Center Nagoya Jpn
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