Saka H | Nagoya Univ. Nagoya Jpn
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概要
関連著者
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Saka H
Nagoya Univ. Nagoya Jpn
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SAKA H.
Graduate School of Engineering, Nagoya University
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KURODA Kotaro
Graduate School of Engineering, Nagoya University
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Kuroda Kotaro
Department Of Quantum Engineering Nagoya University
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TSUJI Satoshi
Yamato Site, IBM Japan, Ltd
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Tsuji Satoshi
Display Business Unit Ibm Japan Ltd.
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Saka H.
Department Of Materials Science And Engineering Faculty Of Engineering Nagoya University
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KURODA Kotaro
Department of Materials Science and Engineering, Nagoya University
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SAKA Hiroyasu
Department of Quantum Engineering, Nagoya University
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SAKA Hiroyasu
Graduate School of Engineering, Nagoya University
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Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
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TSUJIMOTO Katsuhiro
Research Laboratory for High Voltage Electron Microscopy, Kyushu University
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Kuroda Kotaro
Graduate School Of Engineering Nagoya University
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Kuroda Kotaro
Department Of Engineering Nagoya University
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TAKATSUJI Hiroshi
Display Business Unit, IBM Japan Ltd.
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TSUJI Satoshi
Display Business Unit, IBM Japan Ltd.
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Sasaki K.
Department of Quantum Science and Energy Engineering, Tohoku University
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SAKA H.
Department of Materials Science and Engineering, Faculty of Engineering, Nagoya University
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ARII T.
National Institute for Physiological Sciences
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Takatsuji Hiroshi
Display Business Unit Ibm Japan Ltd.
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Tsujimoto Katsuhiro
Research Laboratory Of High-voltage Electron Microscope Kyushu University
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Tsujimoto Katsuhiro
Research Laboratory For High Voltage Electron Microscopy Kyushu University
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Ikuhara Y
Univ. Tokyo Tokyo Jpn
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SASAKI Y.
Japan Fine Ceramics Center
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ZHOU W.
Japan Fine Ceramics Center
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IKUHARA Y.
Japan Fine Ceramics Center
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SAKA H.
Nagoya University, Department of Quantum Engineering
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Sasaki K.
Department Of Quantum Science And Energy Engineering Tohoku University
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Abe S.
Department of Anatomy, Faculty of Medicine, Kyoto University
著作論文
- Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis
- Novel Transparent Conductive Indium Zinc Oxide Thin Films with Unique Properties
- Vibrational Motion of Grain Boundary in Intermetallic Compound Induced by Electron Beam Irradiation
- Cascade Defects as Flux Pinning Centers in Bi_2Sr_2CaCu_2O_x Single Crystal Generated by Ion Irradiation
- FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si