Cascade Defects as Flux Pinning Centers in Bi_2Sr_2CaCu_2O_x Single Crystal Generated by Ion Irradiation

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概要

• 論文の詳細を見る

著者

• Saka H

  Nagoya Univ. Nagoya Jpn

• Ikuhara Y

  Univ. Tokyo Tokyo Jpn

• SASAKI Y.

  Japan Fine Ceramics Center

• ZHOU W.

  Japan Fine Ceramics Center

• IKUHARA Y.

  Japan Fine Ceramics Center

• SAKA H.

  Nagoya University, Department of Quantum Engineering

• SAKA H.

  Graduate School of Engineering, Nagoya University

関連論文

• Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis
• Novel Transparent Conductive Indium Zinc Oxide Thin Films with Unique Properties
• Vibrational Motion of Grain Boundary in Intermetallic Compound Induced by Electron Beam Irradiation
• Cascade Defects as Flux Pinning Centers in Bi_2Sr_2CaCu_2O_x Single Crystal Generated by Ion Irradiation
• FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si

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