Effect of Pt Substitution by Cu on Structural and Morphological Changes in Fe-Pt Nanoparticles during Annealing as Studied by In-situ Transmission Electron Microscopy
スポンサーリンク
概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2007-10-01
著者
-
KURODA Kotaro
Department of Materials Science and Engineering, Nagoya University
-
Sasaki Katsuhiro
Department Of Physics Graduate School Of Science Tohoku University
-
Kamino Takeo
Naka Application Center Hitachi High-technologies Corporation
-
NAKANISHI Masatoshi
Department of Quantum Engineering, Nagoya University
-
FURUSAWA Gen-ichi
Analysis Technology Center, FUJIFILM Corporation
-
WAKI Kokichi
Frontier Core Technology Laboratories, FUJIFILM Corporation
-
HATTORI Yasushi
Recording Media Research & Development Laboratories, FUJIFILM Corporation
-
SAKA Hiroyasu
Department of Quantum Engineering, Nagoya University
-
KATO Takeharu
Japan Fine Ceramics Center
-
Kamino T
Naka Application Center Hitachi High-technologies Corporation
-
Waki Kokichi
Frontier Core Technology Laboratories Fujifilm Corporation
-
Saka H
Department Of Quantum Engineering Nagoya University
-
Kuroda Kotaro
Department Of Quantum Engineering Nagoya University
-
Sakaki Katsuhiro
Department Of Quantum Engineering Nagoya University
-
Hattori Yasushi
Recording Media Research & Development Laboratories Fujifilm Corporation
-
Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
-
Kuroda Kotaro
Graduate School Of Engineering Nagoya University
-
Kuroda Kotaro
Department Of Engineering Nagoya University
-
Furusawa Gen-ichi
Analysis Technology Center Fujifilm Corporation
-
Nakanishi Masatoshi
Department Of Quantum Engineering Nagoya University
-
Sasaki Katsuhiro
Dep. Of Quantum Engineering Nagoya Univ.
-
Sasaki Katsuhiro
Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University, 1-1 Tegata Gakuen-machi, Akita 010-8502, Japan
-
Nakanishi Masatoshi
Department of Agricultural Chemistry, Faculty of Agriculture, Kyoto University
関連論文
- Sulfide Precipitation in Titanium-Added Steel with Residual Level of Copper (3) : Decrease of Copper Sulfide by Long-Time-Annealing in Ferrite Region
- Sulfide Precipitation in Titanium-Added Steel with Residual Level of Copper (2) : Precipitation in Ferrite Region
- Sulfide Precipitation in Titanium-Added Steel with Residual Level of Copper (1) : Precipitation in Austenite Region
- Nanometer-Order Resolution Displacement Measurement System by Air-Coupled Ultrasonic Wave Introducing Maximum Phase-Sensitivity Tuning
- Submicrometer-Order Displacement Measurements Using an Air-Coupled Ultrasonic Transducer at Frequencies of 40 and 400kHz
- Improved phase-detection method using an air-coupled ultrasonic wave for a few-tens of nanometers displacement measurements
- TEM Observation of Micrometer-Sized Ni Powder Particles Thinned by FIB Cutting Technique
- TEM Observation of Mechanically Alloyed Powder Particles (MAPP) of Mg-Zn Alloy Thinned by the FIB Cutting Technique
- In-situ Electron Holography Observation of FePt Nanoparticles at Elevated Temperatures
- Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperatures
- Effect of Pt Substitution by Cu on Structural and Morphological Changes in Fe-Pt Nanoparticles during Annealing as Studied by In-situ Transmission Electron Microscopy
- Development of a specimen heating holder with an evaporator and gas injector and its application for catalyst
- Development of a gas injection/specimen heating holder for use with transmission electron microscope
- In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particles
- Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites
- A method for multidirectional TEM observation of a specific site at atomic resolution
- In Situ Study of Chemical Reaction between Silicon and Graphite at 1,400℃ in a High Resolution/Analytical Electron Microscope
- Multidirectional observation of an embedded quantum dot
- A new method for preparing plan-view TEM specimen of multilayered films using focused ion beam
- Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling
- Scanning Tunneling Spectroscopy and Microscopy of Highly-Correlated Electron System Superconductors
- Electric-Field Modulation of Thermopower for the KTaO_3 Field-Effect Transistors
- Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam
- Examination of electrostatic potential distribution across an implanted p-n junction by electron holography
- Transmission Electron Microscopy of Interfaces in Joints between Pb-Free Solders and Electroless Ni-P
- Direct Intensification of Electorn Microscopic Images with Silicon Diode Array Target
- Enhancement of Heat Transfer in Calcium Chloride Reactor Bed By Using Graphite Composite Particles
- TEM and HRTEM Observations of Microstructural Change of Silicon Single Crystal Scratched under Very Small Loading Forces by AFM
- Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10kV and 40kV
- A method for characterizing carbon nanotubes
- Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system
- Dilatometry of the Heavy-Fermion Superconductor UPt_3
- In situ HREM observation of nucleation and growth of nanotwins beneath the solid-liquid interface in Si
- Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell
- Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction
- Electron Microscopic Observation of the Reduction Process of Indium Oxide to Indium Metal and on the Formation of a Palladium-Indium Intermetallic Compound in a Thermal Pretreatment Process in Graphite-Furnace Atomic Absorption Spectrometry
- Observation of Vaporization in Palladium-Indium Intermetallic Compounds by Graphite Furnace Atomic Absorption Spectrometry Using Transmission Electron Microscopy
- Characteristics of Light Emission Lifetime of Electroluminescent Phosphor Encapsulated by Titanium-Silicon-Oxide Film(Surfaces, Interfaces, and Films)
- Increased expression of decorin during the regeneration stage of mdx mouse
- A Push-Pull Straining Device for HVEM In-Situ Deformation Experiment
- Dislocation Motions in Strongly Electron-Irradiated Aluminum
- Direct Observation of Dislocation Motions in Iron at Low Temperatures by HVEM
- A New Tensile Testing Device Usable from Room Temperature to -150℃ in an Electron Microscope
- A New Tensile Testing Device Usable at -150℃ for Electron Microscopic Observation
- Efforts to Save Nickel in Austenitic Stainless Steels
- Critical Voltage Effect in Ni_3Fe and FeCo Ordering Alloys
- ネルンスト素子の候補としてのInSb熱電半導体の輸送係数
- 磁場中における熱電変換材料の輸送特性測定
- ペルチェ電流リード及び電流リード用傾斜機能材の提案
- Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis
- Novel Transparent Conductive Indium Zinc Oxide Thin Films with Unique Properties
- Valence Change of Cations in Ceria-Zirconia Solid Solution Associated with Redox Reactions Studied with Electron Energy-Loss Spectroscopy
- Microstructural investigation of ceria-zirconia solid solution with oxygen vacancies
- Straining Apparatus for Dynamic Observation by X-Ray Topography
- Usage of the Fiber Plate Image Orthicon for Quick Video Recording of Electron Microscopic Images
- Direct Observation of Luders Band Propagation in Silicon Iron Single Crystal by HVEM
- Direct Observation of Multiplication of Dislocations in Iron Single Crystal by High Voltage Electron Microscopy (HVEM)
- Microstructures of galvannealing coats plated on an iron substrate deformed by indentation
- FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings
- Stress Measurable Tensile Device for Electron Microscopic Observation
- Direct Observation of Propagation of Crack by High Voltage Electron Microscopy (HVEM)
- On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic Observation
- Direct Measurement of Mobility of Edge and Screw Dislocations in 3% Silicon-Iron by High Voltage Transmission Electron Microscopy
- A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron Microscopy
- Direct Measurements of the Mobilities of Edge and Screw Dislocations in Fe-3%Si Alloy by High Voltage Electron Transmission Microscopy
- TEM Observation of Dislocation Emissin from a Crack at DBTT in SI
- Characterization of microstructures of thermal oxide scales on silicon carbide using transmission electron microscopy
- Low-Frequency Air-Coupled Ultrasonic System beyond Diffraction Limit Using Pinhole
- Nanometer-Order Resolution Displacement Measurement System by Air-Coupled Ultrasonic Wave Introducing Maximum Phase-Sensitivity Tuning
- Characteristics of Indium-Tin-Oxide/Silver/Indium-Tin-Oxide Sandwich Films and Their Application to Simple-Matrix Liquid-Crystal Displays
- Precise Displacement Measurements Using Phase Information of 40 kHz Ultrasonic Waves in Pinhole-Based Air-Coupled Ultrasonic System
- Microstructural characterization of plasma-sprayed oxide ceramics.
- The electrocapillary curves of the phosphatidylcholine monolayer at the polarized oil-water interface. I. Measurement of interfacial tension using a computer-aided pendant-drop method.
- Measurement of the Stress and Strain on Specimens in an Electron Microscope