A New Tensile Testing Device Usable from Room Temperature to -150℃ in an Electron Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1972-09-05
著者
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IMURA Toru
Department of Mechanical Engineering, Aichi Institute of Technology
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SAKA Hiroyasu
Department of Quantum Engineering, Nagoya University
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NODA Kenji
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Noda Kenji
Department Of Metallurgy Faculty Of Engineering Nagoya University
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Imura Toru
Department Of Metallurgy Faculty Of Engineering Nagoya University
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Noda Kenji
Department Of Applied Science For Electronics And Materials Graduate School Of Engineering Sciences
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Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
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Imura Toru
Department Of Mechanical Engineering Aichi Institute Of Technology
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