Measurement of the Stress and Strain on Specimens in an Electron Microscope
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概要
- 論文の詳細を見る
A tensile device is developed which enables one to determine the stress-strain relationship of a specimen being extended during electron microscopic observation. The minimum detectable increment of load is about 0.01 g and the minimum detectable elongation is about 0.1%. Yield points of foils of Al and other metals are observable by 500 kV electron microscopy along the stress-strain curves.
- 社団法人応用物理学会の論文
- 1971-01-05
著者
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Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
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Yukawa Natsuo
Department Of Metallurgy Faculty Of Engineering Nagoya University
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Imura Toru
Department Of Mechanical Engineering Aichi Institute Of Technology
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YUKAWA Natsuo
Department of Metallurgy, Faculty of Engineering, Nagoya University
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