Microstructure of Fe-B-Si Alloy Surface Layers Produced by Laser-Quenching
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-12-15
著者
-
IMURA Toru
Department of Mechanical Engineering, Aichi Institute of Technology
-
Takagi M
Tokyo Inst. Technol. Yokohama Jpn
-
HIROSE Fusao
Nippondenso Research Laboratories
-
TAKAGI Makoto
Nippondenso Research Laboratories
-
MORI Hideshi
Production Engineering R&D Department, Nippondenso Co., Ltd.,
-
KITOH Yasuo
Research Department, Nippondenso Co., Ltd.,
-
Kitoh Y
Osaka Univ. Osaka Jpn
-
Kitoh Yasuo
Research & Development Department Nippondenso Co. Ltd.
-
Hirose F
Mitsubishi Heavy Ind. Ltd. Yokohama Jpn
-
Mori Hideshi
Production Engineering R&d Department Nippondenso Co. Ltd.
-
Imura Toru
Department Of Mechanical Engineering Aichi Institute Of Technology
関連論文
- Deformation Behavior of Pt-based Metallic Glass at Elevated Temperatures
- Crystallization of Zr_Al_Ni_5Cu_ Bulk Metallic Glass Composites Containing ZrC Particles
- Microstructure of Superplastic Zr_Al_Ni_Cu_ Metallic Glass
- Quick Re-Ordering of Long-Range Order across the APB Wall Moving with a Superlattice Dislocation and the Anomalous Yield-Stress Peak in β-Brass
- Surface Hydrogen Desorption as a Rate-Limiting Process in Silane Gas-Source Molecular Beam Epitaxy
- High Quality Silicon Epitaxy at 500℃ using Silane Gas-Source Molecular Beam Technique
- Fabrication of Josephson Junctions by Focused Electron Beam Irradiation
- Fabrication of DC Supereonducting Quantum Interference Devices with Hybrid Structure of Polycrystalline Y_1Ba_2Cu_3O_x Films and Epitaxial Y_1Ba_2Cu_3O_x Films
- Microstructure of Fe-B-Si Alloy Surface Layers Produced by Laser-Quenching
- Direct Intensification of Electorn Microscopic Images with Silicon Diode Array Target
- Electric Resistivity and Cyclic Deformation of Liquid-Quenched Fe-Based and Co-Based Amorphous Alloys
- High Temperature Hardness of Titanium Diboride Single Crystal
- A Push-Pull Straining Device for HVEM In-Situ Deformation Experiment
- Dislocation Motions in Strongly Electron-Irradiated Aluminum
- Direct Observation of Dislocation Motions in Iron at Low Temperatures by HVEM
- A New Tensile Testing Device Usable from Room Temperature to -150℃ in an Electron Microscope
- A New Tensile Testing Device Usable at -150℃ for Electron Microscopic Observation
- Dislocation Mobility and Yield Stress in Silver and Silver-Tin Dilute Alloy Single Crystals
- Straining Apparatus for Dynamic Observation by X-Ray Topography
- Usage of the Fiber Plate Image Orthicon for Quick Video Recording of Electron Microscopic Images
- Direct Observation of Luders Band Propagation in Silicon Iron Single Crystal by HVEM
- Direct Observation of Multiplication of Dislocations in Iron Single Crystal by High Voltage Electron Microscopy (HVEM)
- Growth of IVa-Diborides Single Crystals in Molten Iron
- Yield Stress in Silver and Silver-Tin Dilute Alloy Single Crystals
- Dislocation Generation in the Initiation of Fractures in Silicon Crystals
- Stress Measurable Tensile Device for Electron Microscopic Observation
- Direct Observation of Propagation of Crack by High Voltage Electron Microscopy (HVEM)
- On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic Observation
- Direct Measurement of Mobility of Edge and Screw Dislocations in 3% Silicon-Iron by High Voltage Transmission Electron Microscopy
- A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron Microscopy
- Direct Measurements of the Mobilities of Edge and Screw Dislocations in Fe-3%Si Alloy by High Voltage Electron Transmission Microscopy
- Silicon Cluster Terminated by Hydrogen, Fluorine and Oxygen Atoms : A Correlation with Visible Luminescence of Porous Silicon
- Hardness Anisotropy of Single Crystals of IVa-Diborides
- Destruction and Recovery of Superconductivity in Bi-Pb-Sr-Ca-Cu-O Synthesized under High Pressure
- Direct Observations of Dislocation Motion in an Al-Mg Solid-Solution Alloy in Three Different Temperature Ranges by HVEM
- Stress-Strain Measurable High-Temperature Tensile Test Device for Use with Electron Microscope
- On the Microwelding of Tensile Test Pieces for Transmission Electron Microscopic Observation
- High Pressure Hot-Pressing of Y_1Ba_2Cu_3O_ Superconductor
- Preparation and Characterization of Grain Boundary Josephson Junction from Amorphous Thin Film
- Resputtering Effect on Y_1Ba_2Cu_3O_ Thin Films Prepared by RF-Magnetron Sputtering
- Preparation of Bulky Bi(Pb)-Sr-Ca-Cu-O Superconductor by Magnetized Twin-Roll
- High-Pressure Synthesis of a Bi-Pb-Sr-Ca-Cu-O Superconductor
- Photoluminescence Observation of Defects in Silicon : B-3: CRYSTAL GROWTH AND DEFECTS
- An Evidence of Small Domain Superlattice in Cu-10.37 at% Al Solid Solution Alloy
- Fatigue Behaviour of Amorphous Metal Ribbons
- On the Precise Determination of Stacking Fault Energies in Metals and Alloys
- Observational Study on the Dendritie Growth of Al-Mg Single Crystals by Real-Time X-Ray Topography
- Real-Time X-Ray Topographic Observation of Crystal Growth of Gallium from Melt
- DETERMINATION AND IDENTIFICATION OF ATOMIC STRUCTURE OF AMORPHOUS ALLOYS
- Fivefold Twinned Small Copper Crystals Grown by Reduction of CuI
- Stress-Extension Behavior of Copper-Tin Alloy Whiskers
- Hydraulic-Type Tensile Device for Transmission Electron Microscopy
- The Anomaly in Temperature Dependence of the Yield Stress of Silver Base Solid Solutions
- Solid Solution Hardening of Silver Single Crystals by Indium, by Tin and by Antimony
- In Situ Heating Device for Real Time X-Ray Topography on Crystal Growth from the Melt
- Dislocation Motion in Silver Single Crystals
- Microstructural characterization of plasma-sprayed oxide ceramics.
- Measurement of the Stress and Strain on Specimens in an Electron Microscope