Microstructural characterization of plasma-sprayed oxide ceramics.
スポンサーリンク
概要
- 論文の詳細を見る
Microstructural and microchemical characterization has been carried out on plasma-sprayed zircon (ZrSiO4) and alumina-chromia (Al2O3–5wt%Cr2O3) by transmission electron microscopy and energy dispersive X–ray analysis. The as–sprayed zircon coatings consist of zirconia and silica glass as a result of phase separation during rapid cooling in the plasma–spraying process. Zirconia shows a tetragonal structure for small particles and a monoclinic for large particles. The zircon coatings annealed at 1 300°C for 96 h in air show a mixture of zircon and monoclinic zirconia phases. Alumina–chromia coatings plasma–sprayed with N2 gas consist mainly of a polycrystalline alumina–chromia solid solution with a typical grain size of 0.4 μm. Fine precipitates are observed frequently along the grain boundaries in the coatings sprayed with Ar–H2 gas mixture or N2–H2 gas mixture. The fine precipitates are a metallic Cr–rich Cr–Al alloy formed by reduction of Cr2O3 and Al2O3 during the plasma-spraying process. These precipitates disappear during annealing at temperatures higher than 1 300°C for 96 h in air. The precipitates affect the wear resistance of the coatings.
著者
-
Saka Hiroyasu
Department Of Merallurgy Faculty Of Ecgineering Nagoya University
-
Kuroda Kotaro
Department Of Engineering Nagoya University
-
Imura Toru
Department Of Mechanical Engineering Aichi Institute Of Technology
-
Tamura Shin-ichi
Fine Ceramics Development Department, Process Development Division, Plant Engineering and Technology Bureau, Nippon Steel Corporation
-
Hanagiri Seiji
Fine Ceramics Development Department, Process Development Division, Plant Engineering and Technology Bureau, Nippon Steel Corporation
-
Suginoshita Makoto
Department of Metallurgy, Faculty of Engineering, Nagoya University
-
Taira Hatsuo
Fine Ceramics Development Department, Process Development Division, Plant Engineering and Technology Bureau, Nippon Steel Corporation
-
Kuroda Kotaro
Department of Metallurgy, Faculty of Engineering, Nagoya University
関連論文
- Sulfide Precipitation in Titanium-Added Steel with Residual Level of Copper (3) : Decrease of Copper Sulfide by Long-Time-Annealing in Ferrite Region
- Sulfide Precipitation in Titanium-Added Steel with Residual Level of Copper (2) : Precipitation in Ferrite Region
- Sulfide Precipitation in Titanium-Added Steel with Residual Level of Copper (1) : Precipitation in Austenite Region
- Deformation Behavior of Pt-based Metallic Glass at Elevated Temperatures
- Crystallization of Zr_Al_Ni_5Cu_ Bulk Metallic Glass Composites Containing ZrC Particles
- Microstructure of Superplastic Zr_Al_Ni_Cu_ Metallic Glass
- Quick Re-Ordering of Long-Range Order across the APB Wall Moving with a Superlattice Dislocation and the Anomalous Yield-Stress Peak in β-Brass
- In-situ Electron Holography Observation of FePt Nanoparticles at Elevated Temperatures
- Effect of Pt Substitution by Cu on Structural and Morphological Changes in Fe-Pt Nanoparticles during Annealing as Studied by In-situ Transmission Electron Microscopy
- Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites
- Fabrication of Josephson Junctions by Focused Electron Beam Irradiation
- Fabrication of DC Supereonducting Quantum Interference Devices with Hybrid Structure of Polycrystalline Y_1Ba_2Cu_3O_x Films and Epitaxial Y_1Ba_2Cu_3O_x Films
- Microstructure of Fe-B-Si Alloy Surface Layers Produced by Laser-Quenching
- Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam
- Examination of electrostatic potential distribution across an implanted p-n junction by electron holography
- Transmission Electron Microscopy of Interfaces in Joints between Pb-Free Solders and Electroless Ni-P
- Direct Intensification of Electorn Microscopic Images with Silicon Diode Array Target
- Electric Resistivity and Cyclic Deformation of Liquid-Quenched Fe-Based and Co-Based Amorphous Alloys
- TEM and HRTEM Observations of Microstructural Change of Silicon Single Crystal Scratched under Very Small Loading Forces by AFM
- High Temperature Hardness of Titanium Diboride Single Crystal
- In situ HREM observation of nucleation and growth of nanotwins beneath the solid-liquid interface in Si
- Characteristics of Light Emission Lifetime of Electroluminescent Phosphor Encapsulated by Titanium-Silicon-Oxide Film(Surfaces, Interfaces, and Films)
- A Push-Pull Straining Device for HVEM In-Situ Deformation Experiment
- Dislocation Motions in Strongly Electron-Irradiated Aluminum
- Direct Observation of Dislocation Motions in Iron at Low Temperatures by HVEM
- A New Tensile Testing Device Usable from Room Temperature to -150℃ in an Electron Microscope
- A New Tensile Testing Device Usable at -150℃ for Electron Microscopic Observation
- Efforts to Save Nickel in Austenitic Stainless Steels
- Critical Voltage Effect in Ni_3Fe and FeCo Ordering Alloys
- ネルンスト素子の候補としてのInSb熱電半導体の輸送係数
- 磁場中における熱電変換材料の輸送特性測定
- ペルチェ電流リード及び電流リード用傾斜機能材の提案
- Novel Transparent Conductive Indium Zinc Oxide Thin Films with Unique Properties
- Valence Change of Cations in Ceria-Zirconia Solid Solution Associated with Redox Reactions Studied with Electron Energy-Loss Spectroscopy
- Microstructural investigation of ceria-zirconia solid solution with oxygen vacancies
- Dislocation Mobility and Yield Stress in Silver and Silver-Tin Dilute Alloy Single Crystals
- Straining Apparatus for Dynamic Observation by X-Ray Topography
- Usage of the Fiber Plate Image Orthicon for Quick Video Recording of Electron Microscopic Images
- Direct Observation of Luders Band Propagation in Silicon Iron Single Crystal by HVEM
- Direct Observation of Multiplication of Dislocations in Iron Single Crystal by High Voltage Electron Microscopy (HVEM)
- Growth of IVa-Diborides Single Crystals in Molten Iron
- Microstructures of galvannealing coats plated on an iron substrate deformed by indentation
- Yield Stress in Silver and Silver-Tin Dilute Alloy Single Crystals
- Dislocation Generation in the Initiation of Fractures in Silicon Crystals
- FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings
- Stress Measurable Tensile Device for Electron Microscopic Observation
- Direct Observation of Propagation of Crack by High Voltage Electron Microscopy (HVEM)
- On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic Observation
- Direct Measurement of Mobility of Edge and Screw Dislocations in 3% Silicon-Iron by High Voltage Transmission Electron Microscopy
- A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron Microscopy
- Direct Measurements of the Mobilities of Edge and Screw Dislocations in Fe-3%Si Alloy by High Voltage Electron Transmission Microscopy
- Hardness Anisotropy of Single Crystals of IVa-Diborides
- Destruction and Recovery of Superconductivity in Bi-Pb-Sr-Ca-Cu-O Synthesized under High Pressure
- Direct Observations of Dislocation Motion in an Al-Mg Solid-Solution Alloy in Three Different Temperature Ranges by HVEM
- Stress-Strain Measurable High-Temperature Tensile Test Device for Use with Electron Microscope
- On the Microwelding of Tensile Test Pieces for Transmission Electron Microscopic Observation
- High Pressure Hot-Pressing of Y_1Ba_2Cu_3O_ Superconductor
- Preparation and Characterization of Grain Boundary Josephson Junction from Amorphous Thin Film
- Resputtering Effect on Y_1Ba_2Cu_3O_ Thin Films Prepared by RF-Magnetron Sputtering
- Preparation of Bulky Bi(Pb)-Sr-Ca-Cu-O Superconductor by Magnetized Twin-Roll
- High-Pressure Synthesis of a Bi-Pb-Sr-Ca-Cu-O Superconductor
- TEM Observation of Dislocation Emissin from a Crack at DBTT in SI
- Photoluminescence Observation of Defects in Silicon : B-3: CRYSTAL GROWTH AND DEFECTS
- An Evidence of Small Domain Superlattice in Cu-10.37 at% Al Solid Solution Alloy
- Fatigue Behaviour of Amorphous Metal Ribbons
- On the Precise Determination of Stacking Fault Energies in Metals and Alloys
- Observational Study on the Dendritie Growth of Al-Mg Single Crystals by Real-Time X-Ray Topography
- Real-Time X-Ray Topographic Observation of Crystal Growth of Gallium from Melt
- DETERMINATION AND IDENTIFICATION OF ATOMIC STRUCTURE OF AMORPHOUS ALLOYS
- Fivefold Twinned Small Copper Crystals Grown by Reduction of CuI
- Stress-Extension Behavior of Copper-Tin Alloy Whiskers
- Hydraulic-Type Tensile Device for Transmission Electron Microscopy
- The Anomaly in Temperature Dependence of the Yield Stress of Silver Base Solid Solutions
- Solid Solution Hardening of Silver Single Crystals by Indium, by Tin and by Antimony
- In Situ Heating Device for Real Time X-Ray Topography on Crystal Growth from the Melt
- Dislocation Motion in Silver Single Crystals
- Characterization of microstructures of thermal oxide scales on silicon carbide using transmission electron microscopy
- Characteristics of Indium-Tin-Oxide/Silver/Indium-Tin-Oxide Sandwich Films and Their Application to Simple-Matrix Liquid-Crystal Displays
- Microstructural characterization of plasma-sprayed oxide ceramics.
- Measurement of the Stress and Strain on Specimens in an Electron Microscope