Real-Time X-Ray Topographic Observation of Crystal Growth of Gallium from Melt
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概要
- 論文の詳細を見る
The growth of gallium single crystal of 99.9999% purity from the melt was observed by real-time X-ray topography. At the solid-liquid interface, (010), (011), (101) and (111) facets were observed. Dislocations, which intersected the facets and propagated into a newly grown crystal, did not influence the faceted growth. The growth mechanism of the faceted growth of gallium is deduced from continuous observation of the growth process.
- 社団法人応用物理学会の論文
- 1986-03-20
著者
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IMURA Toru
Department of Mechanical Engineering, Aichi Institute of Technology
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Kobayashi Tatsumasa
Department Of Metallurgy Faculty Of Engineering Nagoya University
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NISHIKAWA Yoshitaka
Department of Metallurgy, Faculty of Engineering, Nagoya University
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Nishikawa Yoshitaka
Department Of Metallurgy Faculty Of Engineering Nagoya University
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Imura Toru
Department Of Mechanical Engineering Aichi Institute Of Technology
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