Hardness Anisotropy of Single Crystals of IVa-Diborides
スポンサーリンク
概要
- 論文の詳細を見る
Knoop hardness is examined as a function of indenter orientation on the (0001), {101^^-0} and {112^^-0} surfaces of TiB_2, ZrB_2 and HfB_2. The hardness of the two kinds of prismatic planes and the hardness anisotropy of each plane are higher than those of the basal plane in TiB_2. The hardness of the basal plane tends to be higher than that of the prismatic planes in ZrB_2, but the difference between them is not very large. In HfB_2, the difference itself is not large, but contrary to that in ZrB_2 the prismatic planes have a tendency to give higher hardness than the basal plane, and the hardness anisotropy of each plane is small. The measured anisotropy is compared with the result obtained with the analytical method and the main slip system that contributes to the hardness anisotropy of these crystals is discussed.
- 社団法人応用物理学会の論文
- 1973-02-05
著者
-
IMURA Toru
Department of Mechanical Engineering, Aichi Institute of Technology
-
TAKEUCHI Shin
The Institute for Solid State Physics, The University of Tokyo
-
Nakano Kikuo
Government Industrial Research Institute
-
Nakano Kikuo
Government Industrial Reserch Institute
-
Takeuchi Shin
The Institute For Solid State Physics The University Of Tokyo
-
Imura Toru
Department Of Mechanical Engineering Aichi Institute Of Technology
関連論文
- Deformation Behavior of Pt-based Metallic Glass at Elevated Temperatures
- Crystallization of Zr_Al_Ni_5Cu_ Bulk Metallic Glass Composites Containing ZrC Particles
- Microstructure of Superplastic Zr_Al_Ni_Cu_ Metallic Glass
- Quick Re-Ordering of Long-Range Order across the APB Wall Moving with a Superlattice Dislocation and the Anomalous Yield-Stress Peak in β-Brass
- In-Situ Observation of Formation of Staking Faults in Ni_3Ga by Stretching Thin Foils in an Electron Microscope
- Fabrication of Josephson Junctions by Focused Electron Beam Irradiation
- Fabrication of DC Supereonducting Quantum Interference Devices with Hybrid Structure of Polycrystalline Y_1Ba_2Cu_3O_x Films and Epitaxial Y_1Ba_2Cu_3O_x Films
- Microstructure of Fe-B-Si Alloy Surface Layers Produced by Laser-Quenching
- Direct Intensification of Electorn Microscopic Images with Silicon Diode Array Target
- The Nature of Stacking Faults and Partial Dislocations in Deformed Ni_3Ga Single Crystal
- Electric Resistivity and Cyclic Deformation of Liquid-Quenched Fe-Based and Co-Based Amorphous Alloys
- Polarity of the Bending Strength and the Photoplastic Effect in CdS Single Crystals
- High Temperature Hardness of Titanium Diboride Single Crystal
- A Push-Pull Straining Device for HVEM In-Situ Deformation Experiment
- Dislocation Motions in Strongly Electron-Irradiated Aluminum
- Direct Observation of Dislocation Motions in Iron at Low Temperatures by HVEM
- A New Tensile Testing Device Usable from Room Temperature to -150℃ in an Electron Microscope
- A New Tensile Testing Device Usable at -150℃ for Electron Microscopic Observation
- Lifetime Spectra of Positrons in GaAs Deformed by Ga- and As-Bending
- Softening of Al Single Crystals due to Superconducting Transition
- Low Temperature Behavior of Δτ_ for Pb Single Crystal
- Plastic Instability of Tanatalum Single Crystals Compressed at 4.2K
- Dislocation Mobility and Yield Stress in Silver and Silver-Tin Dilute Alloy Single Crystals
- Straining Apparatus for Dynamic Observation by X-Ray Topography
- Usage of the Fiber Plate Image Orthicon for Quick Video Recording of Electron Microscopic Images
- Direct Observation of Luders Band Propagation in Silicon Iron Single Crystal by HVEM
- Direct Observation of Multiplication of Dislocations in Iron Single Crystal by High Voltage Electron Microscopy (HVEM)
- Growth of IVa-Diborides Single Crystals in Molten Iron
- Yield Stress in Silver and Silver-Tin Dilute Alloy Single Crystals
- Dislocation Generation in the Initiation of Fractures in Silicon Crystals
- Stress Measurable Tensile Device for Electron Microscopic Observation
- Direct Observation of Propagation of Crack by High Voltage Electron Microscopy (HVEM)
- On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic Observation
- Direct Measurement of Mobility of Edge and Screw Dislocations in 3% Silicon-Iron by High Voltage Transmission Electron Microscopy
- A Direct Method to Investigate the Dynamical Properties of Dislocations Based on High Voltage Electron Microscopy
- Direct Measurements of the Mobilities of Edge and Screw Dislocations in Fe-3%Si Alloy by High Voltage Electron Transmission Microscopy
- Hardness Anisotropy of Single Crystals of IVa-Diborides
- Destruction and Recovery of Superconductivity in Bi-Pb-Sr-Ca-Cu-O Synthesized under High Pressure
- Thermally Activated motion of a Screw Dislocation in a Model B.C.C. Crystal
- Direct Observations of Dislocation Motion in an Al-Mg Solid-Solution Alloy in Three Different Temperature Ranges by HVEM
- Stress-Strain Measurable High-Temperature Tensile Test Device for Use with Electron Microscope
- On the Microwelding of Tensile Test Pieces for Transmission Electron Microscopic Observation
- High Pressure Hot-Pressing of Y_1Ba_2Cu_3O_ Superconductor
- Preparation and Characterization of Grain Boundary Josephson Junction from Amorphous Thin Film
- Resputtering Effect on Y_1Ba_2Cu_3O_ Thin Films Prepared by RF-Magnetron Sputtering
- Preparation of Bulky Bi(Pb)-Sr-Ca-Cu-O Superconductor by Magnetized Twin-Roll
- High-Pressure Synthesis of a Bi-Pb-Sr-Ca-Cu-O Superconductor
- Plastic Deformation of CdTe Single Crystalks II. Photoplastic Effect of II-VI Compounds
- Plastic Deformation of CdTe Single Crystals. : I. Microscopic Observations
- Crystal Size Dependence of the Photoplastic Effect in CdTe
- Computer Simulation of Atomic Structure of Fe_P_ Amorphous Alloy
- Computer Simulation of Atomic Srtucture of Cu_Zr_ Amorphous Alloy
- Photoluminescence Observation of Defects in Silicon : B-3: CRYSTAL GROWTH AND DEFECTS
- An Evidence of Small Domain Superlattice in Cu-10.37 at% Al Solid Solution Alloy
- Fatigue Behaviour of Amorphous Metal Ribbons
- On the Precise Determination of Stacking Fault Energies in Metals and Alloys
- Steady State Deformation of Crystals Controlled by Motion of Screw Dislocations
- Observational Study on the Dendritie Growth of Al-Mg Single Crystals by Real-Time X-Ray Topography
- Real-Time X-Ray Topographic Observation of Crystal Growth of Gallium from Melt
- DETERMINATION AND IDENTIFICATION OF ATOMIC STRUCTURE OF AMORPHOUS ALLOYS
- ELEMENTARY PROCESS OF DEFORMATION OF AMORPHOUS METALS
- Fivefold Twinned Small Copper Crystals Grown by Reduction of CuI
- Stress-Extension Behavior of Copper-Tin Alloy Whiskers
- Hydraulic-Type Tensile Device for Transmission Electron Microscopy
- The Anomaly in Temperature Dependence of the Yield Stress of Silver Base Solid Solutions
- Solid Solution Hardening of Silver Single Crystals by Indium, by Tin and by Antimony
- In Situ Heating Device for Real Time X-Ray Topography on Crystal Growth from the Melt
- Dislocation Motion in Silver Single Crystals
- A Model of the Yielding of Single Crystals Due to Inhomogeneous Deformation
- Microstructural characterization of plasma-sprayed oxide ceramics.
- Measurement of the Stress and Strain on Specimens in an Electron Microscope
- Enhanced Glide of Dislocations in GaAs Single Crystals by Electron Beam Irradiation