Characterization of Pb(Zr,Ti)O_3 Thin Films on Si Substrates Using MgO Intermediate Layer for Metal/Ferroelectric/Insulator/Semiconductor Field Effect Transistor Devices
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1998-09-01
著者
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Kurihara Koji
Faculty Of Technology Tokyo University Of Agricuture And Technology
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UENO Tomo
Faculty of Technology, Tokyo University of Agriculture and Technology
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Ueno T
Tokyo Univ. Agriculture And Technol. Tokyo Jpn
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Kamisako K
Tokyo Univ. Agriculture And Technol. Tokyo Jpn
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Kuroiwa K
Faculty Of Technology Tokyo University Of Agricuture And Technology
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SENZAKI Junji
Faculty of Technology, Tokyo University of Agriculture and Technology
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Senzaki Junji
Faculty Of Technology Tokyo University Of Agricuture And Technology
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NOMURA Naoki
Faculty of Technology, Tokyo University of Agricuture and Technology
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MITSUNAGA Osamu
Faculty of Technology, Tokyo University of Agricuture and Technology
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IWASKI Yoshitaka
Faculty of Technology, Tokyo University of Agricuture and Technology
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Nomura Naoki
Faculty Of Technology Tokyo University Of Agricuture And Technology
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Iwasaki Yoshitaka
Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588, Japa
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Ueno Tomo
Faculty Of Technology Tokyo University Of Agriculture And Technology
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Mitsunaga Osamu
Faculty Of Technology Tokyo University Of Agricuture And Technology
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Iwaski Yoshitaka
Faculty Of Technology Tokyo University Of Agricuture And Technology
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