Omura Yasuhisa | High-technology Research Center
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概要
関連著者
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Omura Yasuhisa
High-technology Research Center
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Omura Yasuhisa
High-technology Research Center And Faculty Of Engineering Kansai University
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Omura Y
Ntt Lsi Laboratories
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Omura Yasuhisa
Electronics Department Kansai University
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Komiya Kenji
High-technology Research Center
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Omura Y
Electronics High-technology Research Center And Faculty Of Engineering Kansai University
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Kawamura Akira
High-technology Research Center And Faculty Of Engineering Kansai University
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Tamura Susumu
High-technology Research Center And Faculty Of Engineering Kansai University
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KOBAYASHI Hideki
High-Technology Research Center and Faculty of Engineering, Kansai University
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IIDA Yukio
High-Technology Research Center and Faculty of Engineering, Kansai University
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Nakajima Hidehiko
High-technology Research Center And Faculty Of Engineering Kansai University
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Yanagi Shin-ichiro
High-technology Research Center
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Omura Yasuhisa
High-technology Research Center Kansai University
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Nakajima Hidehiko
High-Technology Research Center and Faculty of Engineering, Kansai University
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Kawamura Akira
High-Technology Research Center and Faculty of Engineering, Kansai University
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Komiya Kenji
High-Technology Research Center and Faculty of Engineering, Kansai University
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Kuribayashi Hiroki
Corporate R&d Laboratories Pioneer Corporation
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Nakatsuji Hiroshi
High-technology Research Center And Department Of Electronics Faculty Of Engineering Kansai Universi
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Sumino Daijiro
High-technology Research Center
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Nakahara Sumio
High-technology Research Center And Faculty Of Engineering Kansai University
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Omura Yasuhisa
Department Of Electronics Kansai University
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Iida Y
High-technology Research Center And Faculty Of Engineering Kansai University
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YANAGI Shin-ichiro
High-Technology Research Center and Faculty of Engineering, Kansai University
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NAKAKUBO Atsushi
High-Technology Research Center and Faculty of Engineering, Kansai University
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Nakakubo A
Electronics High-technology Research Center And Faculty Of Engineering Kansai University
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Yanagi S
Kansai Univ.
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Kobayashi H
Institute Of Scientific And Industrial Research Osaka University:crest Japan Science And Technology
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Omura Y
Kansai Univ. Osaka Jpn
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Omura Yasuhisa
High-technology Research Center And Department Of Electronics Faculty Of Engineering Kansai Universi
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Masaoka Akira
High-Technology Research Center, Kansai University
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Sumino Daijiro
High-Technology Research Center, Kansai University
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Ishiyama Toshihiko
Ntt Telecommunications Energy Laboratories
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Komiya Kenji
High-technology Research Center And Faculty Of Engineering Kansai University
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Masaoka Akira
High-technology Research Center Kansai University
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Sumino Daijiro
High-technology Research Center Kansai University
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Sumino Daijiro
High-technology Research Center And Faculty Of Engineering Kansai University
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SHIMIZU Akira
Faculty of Engineering, Yamanashi University
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Omura Yasuhisa
High-technology Research Center Department Of Electronics Kansai University
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SHIMIZU Akira
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai Univer
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Nakakubo Atsushi
Electronics, High-Technology Research Center and Faculty of Engineering, Kansai University
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Yanagi Shin-ichiro
High-technology Research Center Department Of Electronics Kansai University
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KOTANI Yasumi
High-Technology Research Center and Faculty of Engineering, Kansai University
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Matsuo Akira
High-Technology Research Center
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Kotani Yasumi
High-technology Research Center And Faculty Of Engineering Kansai University
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Shimizu Akira
Faculty Of Engineering Kansai University
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Nakatsuji Hiroshi
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
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Tamura Susumu
High-Technology Research Center, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
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Hyodo Yoshinori
High-Technology Research Center, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
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Nakamori Yasuhiko
High-Technology Research Center, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
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Omura Yasuhisa
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
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Komiya Kenji
High-Technology Research Center, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
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Shimizu Akira
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
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Nakahara Sumio
High-Technology Research Center, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
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Iida Yukio
High-Technology Research Center and Faculty of Engineering, Kansai University, Suita-shi 564-8680, Japan
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Komiya Kenji
High-Technology Research Center and Faculty of Engineering, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
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Omura Yasuhisa
High-Technology Research Center and Faculty of Engineering, Kansai University, Suita-shi 564-8680, Japan
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Nakajima Hidehiko
High-Technology Research Center and Faculty of Engineering, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
著作論文
- Simulation Models for Silicon-on Insulator Tunneling-Barrie-Junction Metal-Oxide-Semiconductor Field-Effect Transistor and Performance Perspective
- Simulation Models for Silicon-on-Insulator Tunneling-Barrier-Junction Metal-Oxide-Semiconductor Field-Effect Transistor and Performance Perspective
- Theory of carrier-density-fluctuation-induced transport noise in metal-oxide-semiconductor field-effect transistors
- Single-Mode Silicon Optical Switch with T-Shaped SiO_2 Optical Waveguide as a Control Gate
- Study on Silicon Optical Switch with T-Shape SiO_2 Waveguide as an Optical Control Gate
- An Improved Theory for Direct-Tunneling Current Characterization in a Metal-Oxide-Semiconductor System with Nanometer-Thick Silicon Dioxide Film
- Effect of Silicon Addtion on Electrical Properties of SrBi2Ta2O9 Thin Films
- A Partial-Ground-Plane (PGP) Silicon-on-Insulator (SOI) Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) for Deep Sub-0.1μm Channel Regime
- Proposal of a Partial-Ground-Plane(PGP) Silicon-on-Insulator(SOI) MOSFET for Deep Sub-100-nm Channel Regime
- Analysis of Interface Microstructure Evolution in Separation by IMplanted OXygen(SIMOX)Wafers
- Effect of Silicon Addtion on the Electrical Properties of SrBi2Ta2O9 Thin Films
- Consideration of Performance Limitation of Sub-100-nm Double-Gate Silicon-on-Insulator (SOI) Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) : Electnical Properties of Condensed Malter
- Quantitative Evaluation of Quantum Mechanical Influence on Flat-Band Capacitance of Poly-Si/SiO_2/Si Substrate System and the Impact of Oxide Charge Density
- Analysis of Thin Oxide Growth Mechanisms in Partial-Pressure Rapid-Thermal Oxidation of Silicon
- Compact Equivalent-Circuit Model for Snap-Back Phenomena in Ultra-Thin SOI MOSFET's and Practical Guideline for ESD-Protection Device Design
- Two-Dimensional Quantization Effect on Indirect Tunneling in an Insulated-Gate Lateral pn-Junction Structure with a Thin Silicon Layer
- Significant initial stress under cyclic application of constant-current stress to thin SiO_2 films
- Significant Impact of Transport Noise Enhancement in Scaled-Down MOSFET's
- Simulation Models for Silicon-on-Insulator Tunneling-Barrier-Junction Metal–Oxide–Semiconductor Field-Effect Transistor and Performance Perspective
- Effect of Silicon Addition on Electrical Properties of SrBi2Ta2O9 Thin Films
- Physics-Based Analytical Model of Quantum-Mechanical Electron Wave Function Penetration into Thin Dielectric Films and Capacitance Evaluation
- Quantum Mechanical Influence on Flat-Band Capacitance in Metal-Oxide-Semiconductor Structures with a Nanometer-Thick Silicon Oxide Film and the Impact of Oxide Charge Evaluation
- Single-Mode Silicon Optical Switch with T-Shaped SiO2 Optical Waveguide as a Control Gate