Nakatsuji Hiroshi | High-technology Research Center And Department Of Electronics Faculty Of Engineering Kansai Universi
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概要
- Nakatsuji Hiroshiの詳細を見る
- 同名の論文著者
- High-technology Research Center And Department Of Electronics Faculty Of Engineering Kansai Universiの論文著者
関連著者
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Nakatsuji Hiroshi
High-technology Research Center And Department Of Electronics Faculty Of Engineering Kansai Universi
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中辻 博
京都大学大学院工学研究科
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Omura Yasuhisa
High-technology Research Center And Faculty Of Engineering Kansai University
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Omura Yasuhisa
High-technology Research Center
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清水 明
Center For Atmospheric And Oceanic Studies Graduate School Of Science Tohoku University
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SHIMIZU Akira
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai Univer
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Omura Y
Kansai Univ. Osaka Jpn
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Omura Y
Ntt Lsi Laboratories
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Omura Yasuhisa
Electronics Department Kansai University
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Nakatsuji Hiroshi
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
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Omura Yasuhisa
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
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Shimizu Akira
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
著作論文
- An Improved Theory for Direct-Tunneling Current Characterization in a Metal-Oxide-Semiconductor System with Nanometer-Thick Silicon Dioxide Film
- Quantum Mechanical Influence on Flat-Band Capacitance for Metal-Oxide-Semiconductor Structures with Nanometer-Thick Silicon Oxide Film and the Impact of Oxide Charge Evaluation
- Quantum Mechanical Influence on Flat-Band Capacitance in Metal-Oxide-Semiconductor Structures with a Nanometer-Thick Silicon Oxide Film and the Impact of Oxide Charge Evaluation
- Quantum Mechanical Influence on Flat-Band Capacitance in Metal-Oxide-Semiconductor Structures with a Nanometer-Thick Silicon Oxide Film and the Impact of Oxide Charge Evaluation