Quantum Mechanical Influence on Flat-Band Capacitance for Metal-Oxide-Semiconductor Structures with Nanometer-Thick Silicon Oxide Film and the Impact of Oxide Charge Evaluation
スポンサーリンク
概要
著者
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中辻 博
京都大学大学院工学研究科
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Omura Y
Ntt Lsi Laboratories
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Omura Yasuhisa
Electronics Department Kansai University
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Nakatsuji Hiroshi
High-technology Research Center And Department Of Electronics Faculty Of Engineering Kansai Universi
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清水 明
Center For Atmospheric And Oceanic Studies Graduate School Of Science Tohoku University
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