Physics-based model of quantum-mechanical wave function penetration into thin dielectric films for evaluating modern MOS capacitors
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概要
著者
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Omura Y
Ntt Lsi Laboratories
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Omura Yasuhisa
Electronics Department Kansai University
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Komiya Kenji
Electronics Department Kansai University
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Nakamori Yasuhiko
Electronics Department, Kansai University
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Moriguchi Kohei
Electronics Department, Kansai University
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Moriguchi Kohei
Electronics Department Kansai University
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Nakamori Yasuhiko
Electronics Department Kansai University
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