Shimizu Akira | High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan

スポンサーリンク

概要

関連著者

Nakatsuji Hiroshi
High-technology Research Center And Department Of Electronics Faculty Of Engineering Kansai Universi
Omura Yasuhisa
High-technology Research Center
SHIMIZU Akira
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai Univer
Nakatsuji Hiroshi
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
Omura Yasuhisa
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan
Shimizu Akira
High-Technology Research Center and Department of Electronics, Faculty of Engineering, Kansai University, 3-3-35, Yamate-cho, Suita, Osaka 564, Japan

著作論文

Quantum Mechanical Influence on Flat-Band Capacitance in Metal-Oxide-Semiconductor Structures with a Nanometer-Thick Silicon Oxide Film and the Impact of Oxide Charge Evaluation

スポンサーリンク