Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[<i>N</i>-(1-naphthyl)-<i>N</i>-phenyl]benzidine Thin Films Fabricated on Indium--Tin Oxide by Kelvin Probe Force Microscopy
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概要
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To clarify the interfacial properties of an organic light-emitting diode (OLED), we discuss the surface potential of organic semiconductor thin films fabricated on an electrode that was measured by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KFM) utilizing frequency modulation (FM). The organic semiconductor films were deposited on a glass/indium--tin-oxide (ITO) substrate by the vacuum evaporation technique using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas on the same substrate. The surface potentials of the crossover area of the deposited thin films were investigated by the nc-AFM/KFM technique. The energy band diagram was depicted, and we observed that the charge behavior of the organic semiconductor depended on the material and the structure.
- 2011-07-25
著者
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Matsushige Kazumi
Department Of Applied Science Faculty Of Engineering Kyushu University
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Satoh Nobuo
Department Of Electronic Science And Engineering Kyoto University
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Fujita Shizuo
Photonics And Electronics Science And Engineering Center Kyoto University
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KOBAYASHI Kei
Office of Society-Academia Collaboration for Innovation, Kyoto University
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Yamada Hirofumi
Department of Electrical Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8510, Japan
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Katori Shigetaka
Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan
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Yahiro Masayuki
Institute of Systems, Information Technologies and Nanotechnologies, Fukuoka 814-0001, Japan
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Kobayashi Kei
Office of Society-Academia Collaboration for Innovation, Kyoto University, Kyoto 615-8520, Japan
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