Effect of Radiation and Impurities on Microscopic Deformation Process in PMMA

概要

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Small-angle X-ray scattering experiments were conducted under various tensile stress levels for poly(methyl methacrylate) with different amounts of impurities and microscopic defects. Compared with a highly purified sample of optical fiber grade, the commercially available samples containing many impurities showed that the generation of submicrocracks starts at much lower stress levels. Furthermore, it was revealed that the number and size of such submicrocracks become larger in samples irradiated by γ-rays, which produce internal microscopic defects. These results suggest that such impurities and microscopic defects existing in the virgin samples tend to become nuclei for the submicrocracks upon the application of a tensile stress, causing a significant influence on the microscopic deformation process in amorphous polymers.
社団法人応用物理学会の論文
1988-01-20