Optical Measurement of Ultrasonic Nanometer Motion of Rough Surface by Two-Wave Mixing in Bi_<12>SiO_<20>
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-07-15
著者
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Miyamoto H
Hitachi Ltd. Tokyo Jpn
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Matsumoto Hirokazu
National Research Laboratory Of Metrology
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HONDA Tokuyuki
National Research Laboratory of Metrology
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YAMASHITA Toshihisa
Suzuki Motor Corporation
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MATSUMOTO Hitoshi
Wireless Research Laboratory, Matsushita Electric Industrial Co., Ltd.
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Yamashita Tsutomu
Recearch Institute Of Electrical Communication Tohoku University
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Matsumoto Hiroshige
Institute On Industrial Science University Of Tokyo
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Yamashita T
The Graduate School Of Engineering Science And The Liquid Crystal Institute Science University Of To
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Honda T
Japan Advanced Inst. Sci. And Technol. Ishikawa Jpn
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Yamashita T
Tohoku Univ. Sendai Jpn
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Matsumoto Hirokazu
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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Matsumoto H
Department Of Earth And Space Science Graduate School Of Science Osaka University
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Yamashita Tetsuo
Department Of Applied Physics Faculty Of Engineering Tohoku University
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Matsumoto Hirokazu
National Institute of Advanced Industrial Science and Technology
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