Investigations of Local Electrical Properties of Pentacene Thin Films by Dual-Probe Atomic Force Microscopy
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概要
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We performed local electrical transport measurement on single grains of a pentacene thin film using a lab-built dual-probe atomic force microscopy (DP-AFM) system. We brought two conducting cantilever tips in contact with a single grain and successfully measured the p-type field-effect characteristics. Moreover, we investigated the effect of contact resistance on the measured characteristics by performing a series of transport measurements while varying tip distance. The contact resistance and hole mobility of the channel region were estimated as 3.1 G$\Omega$ and $2.7\times 10^{-2}$ cm2 V-1 s-1, respectively. The results demonstrate the applicability of the DP-AFM system to the nanometer-scale transport measurement of molecules.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2010-08-25
著者
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KOBAYASHI Kei
Innovative Collaboration Center, Kyoto University
-
Matsushige Kazumi
Department Of Applied Science Faculty Of Engineering Kyushu University
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Yamada Hirofumi
Department Of Electronics Science And Engineering Kyoto University
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Tsunemi Eika
Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan
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Hirose Masaharu
Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan
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Yamada Hirofumi
Department of Electrical Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8510, Japan
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