Molecular Ferroelectricity of Vinylidene Fluoride Oligomer Investigated by Atomic Force Microscopy

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概要

• 論文の詳細を見る

• Nanometer-scale electrical properties of local ferroelectric domains formed in thin films of newly synthesized vinylidene fluoride (VDF) oligomer were investigated by atomic force microscopy (AFM). Local poling and observation of the piezoelectric response revealed that the polarized domains were reversibly formed and erased in a nanometer-thick film by applying dc or pulse voltages between the electrically conductive AFM tip and the bottom electrode. The formed domain size depends on the pulse poling conditions and increases when the magnitude and the duration of a pulse voltage are increased. A local domain with a diameter of 65 nm was successfully created. The results in this work are comparable to those of previous studies performed on ferroelectric polymer thin films, suggesting that this material is one of the promising candidates for ferroelectric applications such as high-density data storages, and for molecular controls of ferroelectric properties.

• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 2001-06-30

著者

• Matsushige Kazumi

  Department Of Applied Science Faculty Of Engineering Kyushu University

• Kubono Atsushi

  Department Of Organic And Polymeric Materials Tokyo Institute Of Technology

• Horiuchi Toshihisa

  Department Of Applied Physics Faculty Of Engineering Kyushu University

• Ishida Kenji

  Department Of Chemical Science And Engineering Graduate School Of Engineering Kobe University

• Noda Kei

  Department Of Electrical And Electronic Engineering Kyoto University

• Horiuchi Toshihisa

  Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan

• Noda Kei

  Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan

• Yamada Hirofumi

  Department of Electrical Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8510, Japan

• Yamada Hirofumi

  Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan

• Ishida Kenji

  Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan

• Kubono Atsushi

  Department of Materials Science and Chemical Engineering, Shizuoka University, Hamamatsu 432-8561, Japan

• Ishida Kenji

  Department of Applied Chemistry, Ibaraki University

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