Solution–TiO2 Interface Probed by Frequency-Modulation Atomic Force Microscopy

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概要

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• The topography and solvation structure of a solution–TiO2 interface were observed in the dark using highly sensitive, frequency-modulated atomic force microscopy (FM-AFM). The nucleation and growth of an ionic solute, KCl, in this study, were observed in constant frequency-shift topography. The force applied to the tip was determined as a function of tip–surface distance. Modulations were identified on some force curves and were found to be related to the site-specific density of water molecules.

• 2009-08-25

著者

• KOBAYASHI Kei

  Innovative Collaboration Center, Kyoto University

• Yamada Hirofumi

  Department Of Electronics Science And Engineering Kyoto University

• KOKAWA Ryohei

  Shimadzu Corp.

• Kimura Kenjiro

  Department Of Biochemistry National Cerebral And Cardiovascular Center Research Institute

• Onishi Hiroshi

  Department F Genetic Information Division Of Molecular Life Science School Of Medicine Tokai Univers

• Hiasa Takumi

  Department of Chemistry, Graduate School of Science, Kobe University, Kobe 657-8501, Japan

• Hiasa Takumi

  Department of Chemistry, Kobe University, Kobe 657-8501, Japan

• Ohta Masahiro

  Shimadzu Corporation, Kyoto 604-8511, Japan

• Watanabe Kazuyuki

  Shimadzu Corporation, Kyoto 604-8511, Japan

• Oyabu Noriaki

  Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan

• Yamada Hirofumi

  Department of Electrical Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8510, Japan

• Kokawa Ryohei

  Shimadzu Corporation, Kyoto 604-8511, Japan

• Kobayashi Kei

  Innovative Collaboration Center, Kyoto University, Kyoto 606-8501, Japan

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