KOBAYASHI Kei | Office of Society-Academia Collaboration for Innovation, Kyoto University

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概要

• 同名の論文著者
• Office of Society-Academia Collaboration for Innovation, Kyoto Universityの論文著者

関連著者

• Matsushige Kazumi

  Department Of Applied Science Faculty Of Engineering Kyushu University

• KOBAYASHI Kei

  Office of Society-Academia Collaboration for Innovation, Kyoto University

• Yamada Hirofumi

  Department of Electrical Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8510, Japan

• 山田 弘司

  核融合科学研究所

• Hamada Y

  Nagoya Municipal Industrial Res. Inst. Nagoya Jpn

• MIYATO Yuji

  Department of Electronic Science and Engineering, Kyoto University

• HAMADA Yasuji

  National Institute for Fusion Science

• Yamada H

  Department Of Electronics Nagoya University

• 松重 和美

  京都大学工学研究科電子物性工学専攻

• Kamigaki K

  College Of Liberal Arts Toyama University

• OYABU Noriaki

  Department of Electronic Engineering

• Kurihara K

  Ntt Basic Research Laboratories

• Satoh Nobuo

  Department Of Electronic Science And Engineering Kyoto University

• Kimura Tomoharu

  Department Of Biomedical Engineering Tokai University

• Yamada Hirofumi

  Department Of Electronics Science And Engineering Kyoto University

• Fujita Shizuo

  Photonics And Electronics Science And Engineering Center Kyoto University

• Suzuki Kazuhiro

  Department Of Cardiovascular Surgery Yamaguchi Grand Medical Center

• Suzuki Kazuhiro

  Department Of Electronic Science And Engineering Kyoto University

• Katori Shigetaka

  Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan

• Yahiro Masayuki

  Institute of Systems, Information Technologies and Nanotechnologies, Fukuoka 814-0001, Japan

• Kobayashi Kei

  Office of Society-Academia Collaboration for Innovation, Kyoto University, Kyoto 615-8520, Japan

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著作論文

• Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium--Tin Oxide by Kelvin Probe Force Microscopy
• Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy (Special Issue : Scanning Probe Microscopy)
• Atomic-Resolution Imaging of Graphite-Water Interface by Frequency Modulation Atomic Force Microscopy

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