Development of Surface Hall Potentiometry to Reveal the Variation of Drift Velocity of Carriers in Semiconductor Materials
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概要
- 論文の詳細を見る
Surface Hall potentiometry is a method of detecting the Hall effect occurring in a semiconductor material as the surface potentials change. An experimental setup to detect surface Hall potentials by the Kelvin method is introduced. After we reveal the basic characteristics of surface Hall potentials, a silicon sample is prepared to induce the variation of the drift velocity of carriers. Line-profile measurements of surface Hall potentials with this sample demonstrate that our method reveals the distribution of drift velocities of carriers in semiconductors, which reflects electronic or structural properties such as the carrier type (hole or electron), current density, and thickness.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-04-25
著者
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Arima Kenta
Department Of Precision Science And Technology Graduate School Of Engineering Osaka University
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Morita Mizuho
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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Hidaka Yuji
Department Of Life Science School Of Science And Engineering Kinki University
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Uchikoshi Junichi
Department Of Precision Science And Technology Graduate School Of Engineering Osaka University
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Hiwa Kenji
Department Of Precision Science And Technology Graduate School Of Engineering Osaka University
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Hiwa Kenji
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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Hidaka Yuji
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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