Fabrication and optical evaluation of silica microsphere coated with J-aggregates
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概要
- 論文の詳細を見る
We have fabricated a micrometer-sized nonlinear optical resonator consisting of a silica microsphere coated with J-aggregates of 1,1$'$-diethyl-2,2$'$-cyanine iodide in a thin silica film by a sol–gel process. The sphere diameter was 4.5 μm and the film thickness was estimated to be approximately 100 nm by scanning electron microscopy. The coating on the sphere was characterized by the fluorescence of the J-aggregates and the detection of whispering gallery modes (WGM) in the fluorescence spectrum. The optical evaluation of the sphere was performed in the attenuated-total-reflection configuration. We confirmed that the resonances in the scattering spectrum were due to WGMs, on the basis of a comparison of the experimentally obtained peak positions for coated and noncoated spheres, to those obtained using Mie's theory. The positions of the scattering peaks and the values of the full-width at half-maximum in the scattering spectrum for the coated sphere differ from those of the noncoated sphere.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-08-30
著者
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Fukui Masuo
Department Of Electrical And Electronic Engineering Faculty Of Engineering The University Of Tokushi
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Niimi Tadanobu
Department Of Optical Science And Technology Faculty Of Engineering University Of Tokushima
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Yamaguchi Kenzo
Department Of Optical Science And Technology Faculty Of Engineering University Of Tokushima
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Haraguchi Masanobu
Department Of Electrical And Electronic Engineering Faculty Of Engineering The University Of Tokushi
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Okamoto Toshihiro
Department Of Chemistry The University Of Tokyo
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Haraguchi Masanobu
Department of Optical Science and Technology, Faculty of Engineering, Univerity of Tokushima, 2-1 Minamijosanzima, Tokushima 770-8506, Japan
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Fukui Masuo
Department of Optical Science and Technology, Faculty of Engineering, Univerity of Tokushima, 2-1 Minamijosanzima, Tokushima 770-8506, Japan
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Yamaguchi Kenzo
Department of Optical Science and Technology, Faculty of Engineering, Univerity of Tokushima, 2-1 Minamijosanzima, Tokushima 770-8506, Japan
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Yamaguchi Kenzo
Department of Advanced Materials Science, Faculty of Engineering, Kagawa University, Takamatsu 761-0396, Japan
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Niimi Tadanobu
Department of Optical Science and Technology, Faculty of Engineering, Univerity of Tokushima, 2-1 Minamijosanzima, Tokushima 770-8506, Japan
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Okamoto Toshihiro
Department of Optical Science and Technology, Faculty of Engineering, Univerity of Tokushima, 2-1 Minamijosanzima, Tokushima 770-8506, Japan
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Okamoto Toshihiro
Department of Advanced Electron Devices, The Institute of Scientific and Industrial Research (ISIR), Osaka University, Ibaraki, Osaka 567-0047, Japan
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