ATR Mode of Surface Exciton Polaritons in ZnO Thin Film
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概要
- 論文の詳細を見る
ATR analysis (Kretschmann configuration) has been carried out for cl-surfaceexciton polaritons (SEP's) in anisotropic Zn0 thin films. The effect of additionalboundary conditions (ABC's) on ATR spectra due to the SEP's has been dis-cussed. We employ two typical types of ABC's, i.e. Kliewer-Fuchs type andRimbev-Mahan t>'re. The numerical calculations have clearlv shown that theATR spectra for frequency scans are strongly affected by the form of ABC's.
- 社団法人日本物理学会の論文
- 1984-03-15
著者
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FUKUI Masuo
Department of Optical Science and Technology, Faculty of Engineering, The University of Tokushima
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Kamada Atsushi
Department Of Electronic Engineering Faculty Of Engineering University Of Tokushima
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Kamada Atsushi
Department Of Agricultural Chemistry The University Of Tokyo
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TADA Osamu
Department of Biochemical Science and Technology, Faculty of Agriculture, Kagoshima University
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Fukui Masuo
Department Of Electrical And Electronic Engineering Faculty Of Engineering The University Of Tokushi
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Fukui Masuo
Department Of Electronic Engineering Faculty Of Engineering University Of Tokushima
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Tada Osamu
Department Of Electronic Engineering Faculty Of Engineering University Of Tokushima
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Tada Osamu
Department Of Biochemical Science And Technology Faculty Of Agriculture Kagoshima University
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