In situ Conductance Measurement of a Limited Number of Nanoparticles during Transmission Electron Microscopy Observation
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概要
- 論文の詳細を見る
A technique for measuring the conductance of a small number of particles during transmission electron microcopy (TEM) observation is demonstrated. By using a custom-designed TEM holder, an Au tip was brought into contact with Fe nanodots contained in a SrF2 film deposited on another Au tip. The conductance shows Coulomb-blockade-like characteristics even at room temperature.
- Japan Society of Applied Physicsの論文
- 2005-06-10
著者
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Arita Masashi
Graduate School Of Engineering Hokkaido University
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Takahashi Yasuo
Graduate School Of Information Science And Technology Hokkaido Univ.
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HIROSE Ryusuke
Graduate School of Engineering, Hokkaido University
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Hamada Kouichi
Graduate School Of Engineering Hokkaido University
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Hirose Ryusuke
Graduate School of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo 060-0813, Japan
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Subagyo Agus
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Subagyo Agus
Graduate School of Information Science and Technology, Hokkaido University, Kita-14, Nishi-9, Kita-ku, Sapporo 060-0814, Japan
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Arita Masashi
Graduate School of Information Science and Technology, Hokkaido University, Kita-14, Nishi-9, Kita-ku, Sapporo 060-0814, Japan
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Hamada Kouichi
Graduate School of Information Science and Technology, Hokkaido University, Kita-14, Nishi-9, Kita-ku, Sapporo 060-0814, Japan
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Takahashi Yasuo
Graduate School of Engineering, Oita University
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