Scanning Tunneling Spectroscopy of $c(2{\times}2)$ Reconstructed Fe Thin-Film Surfaces
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概要
- 論文の詳細を見る
Fe thin films with flat surfaces are obtained on a MgO(001) substrate at a growth temperature of 550 K. The surfaces with atomically flat and wide terraces exhibit a $c(2{\times}2)$ reconstructed structure. To evaluate the effect of impurity atoms at the surface on the surface structures, scanning tunneling spectroscopy (STS), reflection high energy electron diffraction (RHEED) and X-ray photoelectron spectroscopy (XPS) studies were performed. The differential conductivity (${dI/dV}$) spectrum of the $c(2{\times}2)$ Fe(001) thin-film surfaces indicates an intense peak at the sample bias voltage of 0.4 V. Since there is no clear evidence of impurity adatoms forming such a surface structure, we expect that the topmost atoms are Fe, and that the observed peak originates from surface states.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-30
著者
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Mukasa Koichi
Graduate School Of Engineering Hokkaido University
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Sawamura Makoto
Crest
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SUEOKA Kazuhisa
Graduate school of Engineering, Hokkaido University, PRESTO, Japan Science and Technology Corporatio
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Oka Hirofumi
Graduate School of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Subagyo Agus
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Subagyo Agus
Graduate School of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Sueoka Kazuhisa
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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