Restoration of Scanning Tunneling Microscope Images by means of Two-Dimensional Maximum Entropy Method
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-05-15
著者
-
MUKASA Koichi
Graduate School of Engineering, Hokkaido University, CREST, Japan Science and Technology Corpporatio
-
Mukasa Koichi
Graduate School Of Engineering Hokkaido University
-
Sueoka Kazuhisa
Nanoelectronics Laboratory Graduate School Of Engineering Hokkaido University
-
TOKIWANO Kazuo
Graduate school of Engineering, Hokkaido University
-
SUEOKA Kazuhisa
Graduate school of Engineering, Hokkaido University, PRESTO, Japan Science and Technology Corporatio
-
Tokiwano Kazuo
Graduate School Of Engineering. Hokkaido University
-
MATSUMOTO Hisanori
Graduate school of Engineering. Hokkaido University
-
HOSOI Hirotaka
Center for Advanced Science and Technology (CAST), Hokkaido University
-
Matsumoto H
Graduate School Of Engineering. Hokkaido University
-
Sueoka Kazuhisa
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
関連論文
- Ion-Shadow Sputter for the Production of STM Tips
- A pH sensor based on electric properties of nanotubes on a glass substrate
- Ultrasensitive detection of organophosphate insecticides by carbon nanotube field-effect transistor
- スピン SPM による磁性体の表面観察
- 交換相互作用力顕微鏡による表面ナノ磁性の観測
- NC-AFMによる磁性体表面観察の現状と可能性
- Exchange Interaction between Magnetic Moments of Ferromagnetic Sample and Tip: Possibility of Atomic-Resolution Images of Exchange Interactions using Exchange Force Microscopy
- 走査型磁気抵抗顕微鏡用カンチレバーの作製と評価V
- プローブ顕微鏡によるスピン計測(特別ワークショップ : スピンエレクトロニクスとその応用)
- 走査型磁気抵抗顕微鏡用カンチレバーの作製と評価IV
- 磁性体円形パターンの磁区構造
- Restoration of Images Obtained from the Scanning Tunneling Microscope
- Scanning Tunneling Microscopy Study of Surface Structure and Magnetism of Fe Thin Films Grown on MgO (001)
- Theoretical Study of the Exchange Interaction and the Exchange Force between Fe Films : Feasibility of Exchange Force Microscopy
- Possibility of Observing Spin-Polarized Tunneling Current Using Scanning Tunneling Microscope with Optically Pumped GaAs
- Spin-Polarized Scanning Tunneling Microscopy Study on Charge Ordering of Reconstructed Fe3O4(001) Film Surfaces (Special Issue: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques)
- Defect-Induced Charge Freezing on Epitaxial Fe_3O_4(001) Film Surfaces Studied by Spin-Polarized Scanning Tunneling Microscopy
- Self-Assembled Low-Dimensional Potassium Structures on GaAs(110)
- Atomic Scale Observation of Domain Boundaries on c(2 × 2) Fe(001) Thin Film Surfaces
- Spin Electronic States and Geometry of Fe Nanowire : Comparison with Au, Pt, Cu, Na, Mg, Al, Si, and Xe Atomic Strands
- Scanning Tunneling Spectroscopy of c(2x2) Reconstructed Fe Thin-Film Surfaces
- Scanning Tunneling Microscopy Observation of Epitaxial bcc-Fe(001) Surface
- Non-Contact Atomic Force Microscopy Observation on GaAs(110) Surface with Tip-Induced Relaxation
- SP-SEM Observation of Magnetic Vortex States in Permalloy Disks
- Restoration of Scanning Tunneling Microscope Images by means of Two-Dimensional Maximum Entropy Method
- Improvement of the MR Cantilever for Scanning Magnetoresistance Microscope
- Photoluminescence of GaAs Tip Apex Excited by Evanescent Wave
- Observation of Organic Molecules by Scanning Tunneling Microscope
- Magnetic Field Measurement using Scanning Magnetoresistance Microscope with Spin-Valve Sensor (Special Issue: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques)
- Connection of Herringbone Ridges on Reconstructed Au(111) Surfaces Observed by Scanning Tunneling Microscopy
- Spin-Polarized Electron Injection through an Fe/InAs Junction
- Electron Spin-Relaxation Times in p-type δ-doped GaAs/AlGaAs Double Heterostructures
- Surface Observation of a Potassium-Doped C_ Thin Film by Scanning Tunneling Microscopy
- Slip Length in Silicon Wafers Caused by Indentation during Heat Treatment
- Pinning Effect on Punched-Out Dislocations in Silicon Wafers Investigated Using Indentation Method
- Spin-Polarized Tunneling between Optically Pumped GaAs(110) Surface and Spin-Polarized Tip
- Effect of Oxide Precipitate Size on Slip Generation in Large Diameter Epitaxial Wafers
- Effect of Oxide Precipitate Sizes on the Mechanical Strength of Czochralski Silicon Wafers
- Direct observation of dynamic force propagation between focal adhesions of cells on microposts by atomic force microscopy
- Atomically Resolved Observations of Antiphase Domain Boundaries in Epitaxial Fe3O4 Films on MgO(001) by Scanning Tunneling Microscopy
- Noncontact Atomic Force Microscopy Observation of Fe3O4(001) Surface
- Scanning Tunneling Microscopy and Spectroscopy on $c(3\sqrt{2}{\times}\sqrt{2})$R45°-C-Reconstructed Cr(001) Thin-Film Surfaces
- Carbon-Induced Superstructure on Cr(001) Thin-Film Surfaces
- Photoluminescence of GaAs Tip Apex Excited by Evanescent Wave
- Self-Assembled Low-Dimensional Potassium Structures on GaAs(110)
- Defect-Induced Charge Freezing on Epitaxial Fe3O4(001) Film Surfaces Studied by Spin-Polarized Scanning Tunneling Microscopy
- Scanning Tunneling Spectroscopy of $c(2{\times}2)$ Reconstructed Fe Thin-Film Surfaces
- Spin-Polarized Electron Injection through an Fe/InAs Junction
- Restoration of Images Obtained from the Scanning Tunneling Microscope
- Non-Contact Atomic Force Microscopy Observation on GaAs(110) Surface with Tip-Induced Relaxation
- Magnetic Field Measurement using Scanning Magnetoresistance Microscope with Spin-Valve Sensor