Scanning Tunneling Microscopy and Spectroscopy on $c(3\sqrt{2}{\times}\sqrt{2})$R45°-C-Reconstructed Cr(001) Thin-Film Surfaces

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We investigate the electronic properties of $c(3\sqrt{2}{\times}\sqrt{2})$R45°-C-reconstructed Cr(001) thin-film surfaces by scanning tunneling microscopy and spectroscopy (STM/STS). We previously observed that $c(3\sqrt{2}{\times}\sqrt{2})$R45°-C/Cr(001) thin-film surfaces yield two types of STM image, line structures along the Cr$\langle 110\rangle$ direction and an atomically resolved image, and discussed interpretations of the STM images in detail in a previous paper [Jpn. J. Appl. Phys. 46 (2007) 5602]. Here, STM measurements reveal that the top and bottom sites of the line structures correspond to the Cr atoms within and between C zig-zag chains in the atomically resolved STM image, respectively. An STS study indicates that $dI/dV$ spectra taken on the top and bottom sites show a single peak at $+0.15$ eV and a main peak at $+0.15$ eV with a shoulder at $+0.32$ eV, respectively.
2008-07-25