Sueoka Kazuhisa | Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
スポンサーリンク
概要
- 同名の論文著者
- Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japanの論文著者
関連著者
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Sueoka Kazuhisa
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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SUEOKA Kazuhisa
Graduate school of Engineering, Hokkaido University, PRESTO, Japan Science and Technology Corporatio
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Mukasa Koichi
Graduate School Of Engineering Hokkaido University
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Subagyo Agus
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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MUKASA Koichi
Graduate School of Engineering, Hokkaido University, CREST, Japan Science and Technology Corpporatio
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Sueoka Kazuhisa
Nanoelectronics Laboratory Graduate School Of Engineering Hokkaido University
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Oka Hirofumi
Graduate School of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Subagyo Agus
Graduate School Of Information Science And Technology Hokkaido University
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SUBAGYO Agus
Graduate School of Information Science and Technology, Hokkaido University
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TOKIWANO Kazuo
Graduate school of Engineering, Hokkaido University
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HOSOI Hirotaka
Graduate school of Engineering, Hokkaido University
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HOSOI Hirotaka
Innovation Plaza Hokkaido, Japan Science and Technology Agency (JST)
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OKA Hirofumi
Graduate School of Engineering. Hokkaido University
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Ishida Nobuyuki
Graduate School Of Engineering Hokkaido University
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Mukasa Koichi
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Mizuno Taichi
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0808, Japan
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Ikeuchi Akira
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0808, Japan
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Hiura Satoshi
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0808, Japan
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Sueoka Kazuhisa
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan
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Hayakawa K
Chiba Univ. Chiba Jpn
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Sawamura Makoto
Cast Hokkaido University
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Sawamura Makoto
Crest
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OHTOMO Norio
Graduate school of Engineering, Hokkaido University
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Tsuchida Masayoshi
Graduate School Of Engineering Hokkaido University
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Hayakawa Kazunobu
CREST, Japan Science and Technology Corporation (JST)
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Tokiwano Kazuo
Graduate School Of Engineering. Hokkaido University
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UEHARA Nobutomo
Graduate School of Engineering, Hokkaido University
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SAWAMURA Makoto
Center for Advanced Science and Technology, Hokkaido University
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MATSUMOTO Hisanori
Graduate school of Engineering. Hokkaido University
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HOSOI Hirotaka
Center for Advanced Science and Technology (CAST), Hokkaido University
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Eilers Guido
German Bank
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Nakamura Motonori
Graduate School of Engineering, Hokkaido University
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EILERS Guido
CREST, Japan Science and Technology Corporation (JST)
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Eilers G
Department Of Material Science And Engineering Nagoya University
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Eilers Guido
Crest Jst Nanoelectronics Laboratory Graduate School Of Engineering Hokkaido University
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Matsumoto H
Graduate School Of Engineering. Hokkaido University
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Tanaka Yukio
Suwa Trust Co. Ltd.
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Nakai Akira
Graduate School of Information Science and Technology, Hokkaido University, Kita-14, Nishi-9, Kita-ku, Sapporo 060-0814, Japan
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Subagyo Agus
Graduate School of Information Science and Technology, Hokkaido University, Kita 14, Nishi 9, Kita-ku, Sapporo 060-0814, Japan
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Subagyo Agus
Graduate School of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Subagyo Agus
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0808, Japan
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Subagyo Agus
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan
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Oishi Suguru
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0808, Japan
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Ikeuchi Akira
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan
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Kaji Eisaku
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan
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Ohtomo Norio
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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Uehara Nobutomo
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Takezaki Taiichi
Graduate School of Information Science and Technology, Hokkaido University, Kita-14 Nishi-9, Kita-ku, Sapporo 060-0814, Japan
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Sueoka Kazuhisa
Graduate School of Information Science and Technology, Hokkaido University, Kita-14, Nishi-9, Kita-ku, Sapporo 060-0814, Japan
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Sueoka Kazuhisa
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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Sueoka Kazuhisa
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0808, Japan
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Hosoi Hirotaka
Innovation Plaza Hokkaido, Japan Science and Technology Agency (JST), Kita-19 Nishi-11, Kita-ku, Sapporo 060-0819, Japan
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Hosoi Hirotaka
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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Hosoi Hirotaka
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0808, Japan
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Mizuno Taichi
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan
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Tsuchida Masayoshi
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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Ishida Nobuyuki
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Yagisawa Daiki
Graduate School of Information Science and Technology, Hokkaido University, Kita-14 Nishi-9, Kita-ku, Sapporo 060-0814, Japan
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Ishida Nobuyuki
Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan
著作論文
- Scanning Tunneling Microscopy Study of Surface Structure and Magnetism of Fe Thin Films Grown on MgO (001)
- Atomic Scale Observation of Domain Boundaries on c(2 × 2) Fe(001) Thin Film Surfaces
- Scanning Tunneling Microscopy Observation of Epitaxial bcc-Fe(001) Surface
- Restoration of Scanning Tunneling Microscope Images by means of Two-Dimensional Maximum Entropy Method
- Improvement of the MR Cantilever for Scanning Magnetoresistance Microscope
- Spin-Polarized Tunneling between Optically Pumped GaAs(110) Surface and Spin-Polarized Tip
- Atomically Resolved Observations of Antiphase Domain Boundaries in Epitaxial Fe3O4 Films on MgO(001) by Scanning Tunneling Microscopy
- Noncontact Atomic Force Microscopy Observation of Fe3O4(001) Surface
- Scanning Tunneling Microscopy and Spectroscopy on $c(3\sqrt{2}{\times}\sqrt{2})$R45°-C-Reconstructed Cr(001) Thin-Film Surfaces
- Carbon-Induced Superstructure on Cr(001) Thin-Film Surfaces
- Self-Assembled Low-Dimensional Potassium Structures on GaAs(110)
- Defect-Induced Charge Freezing on Epitaxial Fe3O4(001) Film Surfaces Studied by Spin-Polarized Scanning Tunneling Microscopy
- Scanning Tunneling Spectroscopy of $c(2{\times}2)$ Reconstructed Fe Thin-Film Surfaces
- Restoration of Images Obtained from the Scanning Tunneling Microscope
- Non-Contact Atomic Force Microscopy Observation on GaAs(110) Surface with Tip-Induced Relaxation
- Magnetic Field Measurement using Scanning Magnetoresistance Microscope with Spin-Valve Sensor