Non-Contact Atomic Force Microscopy Observation on GaAs(110) Surface with Tip-Induced Relaxation
スポンサーリンク
概要
- 論文の詳細を見る
We investigate the tip-sample dependence of atomically resolved non-contact atomic force microscopy (NC-AFM) images of a GaAs(110) surface taken with a tip that can resolve the tip-sample interaction originating from the dangling bonds of Ga atoms and the valence charge distribution around As atoms. Comparing the NC-AFM images taken with various tip-sample distances with a theoretical investigation of tip-sample interactions on the surface, the tip-sample interaction near the As atoms and Ga atoms are experimentally distinguished, and it is suggested that observed NC-AFM images reflect the tip induced surface relaxation.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-07-15
著者
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Mukasa Koichi
Graduate School Of Engineering Hokkaido University
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UEHARA Nobutomo
Graduate School of Engineering, Hokkaido University
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HOSOI Hirotaka
Innovation Plaza Hokkaido, Japan Science and Technology Agency (JST)
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Mukasa Koichi
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Uehara Nobutomo
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Sueoka Kazuhisa
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Hosoi Hirotaka
Innovation Plaza Hokkaido, Japan Science and Technology Agency (JST), Kita-19 Nishi-11, Kita-ku, Sapporo 060-0819, Japan
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