Restoration of Images Obtained from the Scanning Tunneling Microscope
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概要
- 論文の詳細を見る
A new method for the restoration of images obtained from the scanning tunnelingmicroscope (STM) is presented.We regard an image from the STM as a realization ofa stochastic process and assume it to be composed of anunderlying image and noise.The underlying image consists of smoothly varying gray levelsrepresenting the atomic profiles in the STM image.We express the underlying variation along an axis in terms ofan "almost-periodic" function.We can determine the function by applying a recently developed procedureof data analysis, which consists of resolving the nonlinear least-squaresmethod using the maximum entropy method of spectral analysis.This technique is applied to both modeled and actual data.The present method extracts the underlying image from the corrupted data andremoves the horizontal striping effect due to 1/fβ low-frequencyfluctuation.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1998-06-15
著者
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Mukasa Koichi
Graduate School Of Engineering Hokkaido University
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TOKIWANO Kazuo
Graduate school of Engineering, Hokkaido University
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HOSOI Hirotaka
Graduate school of Engineering, Hokkaido University
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OHTOMO Norio
Graduate school of Engineering, Hokkaido University
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Tsuchida Masayoshi
Graduate School Of Engineering Hokkaido University
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Tanaka Yukio
Suwa Trust Co. Ltd.
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Ohtomo Norio
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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Sueoka Kazuhisa
Graduate School of Engineering, Hokkaido University, Kita-13 Nishi-8, Kita-ku, Sapporo 060-8628, Japan
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Sueoka Kazuhisa
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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Hosoi Hirotaka
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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Tsuchida Masayoshi
Graduate school of Engineering, Hokkaido University, Sapporo 060, Japan
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