Direct Observation of Electromigration and Induced Stress in Cu Nanowire
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概要
- 論文の詳細を見る
We report the direct observation of electromigration and induced stress in the Cu nanowire. During the electromigration, the decrease in pulling stress in the nanowire is observed with the modification of the nanowire. When the nanowire reaches the stable state, the single crystal lattice of Cu appears in the nanowire. This suggests that electromigration could be used as method of a annealing of the nanowire.
- Japan Society of Applied Physicsの論文
- 2003-12-01
著者
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Fujisawa Satoru
National Institute Of Advanced Industrial Science And Technology(aist)
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Kikkawa Takamaro
Mirai Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Scienc
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Kizuka Tokushi
Institute Of Industrial Science The University Of Tokyo
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Fujisawa Satoru
National Institute of Advanced Industrial Science and Technology(AIST), 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564, Japan
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